An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy

Autor: Suproniuk, M., Kaminski, P., Miczuga, M., Pawlowski, M., Kozlowski, R., Longeaud, Christophe, Kleider, Jean-Paul

Publikováno v: Przeglad Elektrotechniczny
Przeglad Elektrotechniczny, 2009, 11/2009, pp.93-98
Przeglad Elektrotechniczny, Wydawnictwo Czasopism i Ksia̜żek Technicznych Sigma, 2009, pp.93-98

International audience; An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy has been presented. The system utilises two-dimensional analysis of the photocurrent transients digitally rec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1bf0c1a08f78cd165454653ed76e7c8d
https://centralesupelec.hal.science/hal-00763193

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Photoinduced transient spectroscopy of defect centers in GaN and SiC.

Autor: Kamiński, P., Kozłowski, R., Kozubal, M., Żelazko, J., Miczuga, M., Pawłowski, M.

Publikováno v: Semiconductors; Apr2007, Vol. 41 Issue 4, p414-420, 7p, 1 Diagram, 2 Charts, 8 Graphs

Characterization of defect levels in semi−insulating 6H−SiC by means of photoinduced transient spectroscopyand modulated photocurrent technique

Autor: Christophe Longeaud, Jean-Paul KLEIDER, Kaminski, P., Kozlowski, R., Miczuga, M.

Publikováno v: HAL
Journal of Physics: Condensed Matter
Journal of Physics: Condensed Matter, IOP Publishing, 2009, 21, pp. 045801-045815
Journal of Physics: Condensed Matter, 2009, 21, pp. 045801-045815

ID = 431; International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::189a9349e90ece52680ace23999900a0
https://hal-supelec.archives-ouvertes.fr/hal-00445958