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Determination of thermoelectric properties from micro four-point probe measurements

Autor: Benny Guralnik, Ole Hansen, Andreas R Stilling-Andersen, Søren E Hansen, Kasper A Borup, Besira M Mihiretie, Braulio Beltrán-Pitarch, Henrik H Henrichsen, Rong Lin, Lior Shiv, Bo B Iversen, Peter F Nielsen, Dirch H Petersen

Publikováno v: Guralnik, B, Hansen, O, Stilling-Andersen, A R, Hansen, S E, Borup, K, Mihiretie, B M, Beltrán-Pitarch, B, Henrichsen, H H, Lin, R, Shiv, L, Iversen, B B, Nielsen, P F & Petersen, D H 2022, ' Determination of thermoelectric properties from micro four-point probe measurements ', Measurement Science and Technology, vol. 33, no. 12, 125001 . https://doi.org/10.1088/1361-6501/ac88ea
Guralnik, B, Hansen, O, Stilling-Andersen, A R, Hansen, S E, Borup, K A, Mihiretie, B M, Beltrán-Pitarch, B, Henrichsen, H H, Lin, R, Shiv, L, Iversen, B B, Nielsen, P F & Petersen, D H 2022, ' Determination of thermoelectric properties from micro four-point probe measurements ', Measurement Science and Technology, vol. 33, no. 12, 125001 . https://doi.org/10.1088/1361-6501/ac88ea

Micro four-point probing is a branch of electrical metrology where electrical (and electromagnetic) properties of charge carriers such as conductance, mobility, and tunneling magnetoresistance can be accurately and precisely determined at the μm sca

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f70765cbdff6f0f4061eb149dc5e907
https://pure.au.dk/portal/da/publications/determination-of-thermoelectric-properties-from-micro-fourpoint-probe-measurements(3824d440-3043-4dd8-aa46-0d2f731fa485).html

Wafer-scale graphene quality assessment using micro four-point probe mapping

Autor: Mackenzie, D., Kalhauge, K., Whelan, P., Østergaard, F., Pasternak, I., Strupinski, W., Bøggild, P., Jepsen, P., Petersen, D.

Publikováno v: Mackenzie, D M A, Kalhauge, K G, Whelan, P R, Østergaard, F W, Pasternak, I, Strupinski, W, Bøggild, P, Jepsen, P U & Petersen, D H 2020, ' Wafer-scale graphene quality assessment using micro four-point probe mapping ', Nanotechnology, vol. 31, no. 22, 225709 . https://doi.org/10.1088/1361-6528/ab7677

openaire: EC/H2020/785219/EU//GrapheneCore2 Micro four-point probes (M4PP) provide rapid and automated lithography-free transport properties of planar surfaces including two-dimensional materials. We perform sheet conductance wafer maps of graphene d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3c0a4176564382a9686021e4032c9fa3
https://orbit.dtu.dk/en/publications/2e9239c4-c643-4c1f-b48e-76ebef91e072

Electrical Contact Formation in Micro Four‐Point Probe Measurements

Autor: Ole Hansen, Peter F. Nielsen, Janusz Bogdanowicz, Steven Folkersma, Dirch Hjorth Petersen, Henrik Hartmann Henrichsen, Wilfried Vandervorst, Lior Shiv

Publikováno v: Folkersma, S, Bogdanowicz, J, Petersen, D H, Hansen, O, Henrichsen, H H, Nielsen, P F, Shiv, L & Vandervorst, W 2020, ' Electrical Contact Formation in Micro Four-Point Probe Measurements ', Physica Status Solidi. A: Applications and Materials Science (Online), vol. 217, no. 5, 1900579 . https://doi.org/10.1002/pssa.201900579

Herein, the electrical contact formation between the electrodes of the micro four‐point technique and a semiconducting sample is described. It is shown that the contact is formed in two stages: a voltage‐induced electrical contact formation, foll

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a6727ff5fcc92581f0a83a2d47c5e11
https://doi.org/10.1002/pssa.201900579

Vibration tolerance of micro-electrodes

Autor: Ole Hansen, Dirch Hjorth Petersen, Henrik Hartmann Henrichsen, Fei Wang, Kristoffer Gram Kalhauge

Publikováno v: Kalhauge, K G, Henrichsen, H H, Wang, F, Hansen, O & Petersen, D H 2018, ' Vibration tolerance of micro-electrodes ', Journal of Micromechanics and Microengineering, vol. 28, no. 9, 095010 . https://doi.org/10.1088/1361-6439/aac58e

Micro four-point probe measurements can be used for extremely accurate electrical characterization of advanced electronic materials. The measurements are, however, sensitive to environmental vibrations which may compromise measurement quality severel

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e6e4697523565256954d8c05e3358f22
https://doi.org/10.1088/1361-6439/aac58e