Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mick Phillips"'
Publikováno v:
Journal for ImmunoTherapy of Cancer, Vol 11, Iss Suppl 2 (2023)
Externí odkaz:
https://doaj.org/article/6080a488687e4accb0d3c27295ffa78b
Autor:
Thomas Parks, Danail V. Stoychev, Nicholas Hall, Josh Titlow, Martin J. Booth, Ian M. Dobbie, Mick Phillips, Tiago Susano Pinto, Ilan Davis, Richard M. Parton, Julio Mateos-Langerak, John W. Sedat, David Miguel Susano Pinto
We have developed “Microscope-Cockpit” (Cockpit), a highly adaptable open source user-friendly Python-based GUI environment for precision control of both simple and elaborate bespoke microscope systems. The user environment allows next-generation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9069a8892401665e22f784b3c65120e6
https://ora.ox.ac.uk/objects/uuid:0a9eff98-c979-4e36-92f9-52345a5a1756
https://ora.ox.ac.uk/objects/uuid:0a9eff98-c979-4e36-92f9-52345a5a1756
Autor:
Martin J. Booth, Matthew Wincott, Syed Asad Hussain, Mick Phillips, Nicholas Hall, Jacopo Antonello, Ilan Davis, Karen M. Hampson, Toshiki Kubo, Ian M. Dobbie, Dalia Gala
Specimen induced aberrations can have detrimental effects in all types of high-resolution microscope. In this study, we present a sensorless technique that uses a deformable mirror (DM) to correct aberrations of both the system and sample. Using a la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ca74c24723e90e405228b4e778a8c18
https://doi.org/10.1117/12.2542959
https://doi.org/10.1117/12.2542959
Autor:
Mick Phillips, Osami Sakata, Kazuki Okamoto, Takanori Nagasaki, Takanori Kiguchi, Hiroshi Funakubo, Hidenori Takana, Masahito Yoshino, Tomoaki Yamada, Kentaro Nakamura
Publikováno v:
Applied Physics Letters. 117:042905
In this study, (001)-epitaxial tetragonal phase Pb(Zr, Ti)O3 (PZT) nanorods were fabricated on SrRuO3/SrTiO3 substrates by pulsed laser deposition. The PZT nanorods were self-assembled and grown on the substrate at an elevated oxygen pressure, and sh
Publikováno v:
Nanotechnology. 24(25)
At a single atom thick, it is challenging to distinguish graphene from its substrate using conventional techniques. In this paper we show that friction force microscopy (FFM) is a simple and quick technique for identifying graphene on a range of samp