Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Michio Murahata"'
Autor:
Tadahiko Sugibayashi, Shunsuke Fukami, Keizo Kinoshita, Sadahiko Miura, Hiroaki Honjo, Hideo Ohno, Michio Murahata, Noboru Sakimura, Ayuka Morioka, Yukihide Tsuji, K. Tokutome, Naoki Kasai, Ryusuke Nebashi, Kunihiko Ishihara
Publikováno v:
IEEE Transactions on Magnetics. 50:1-4
We have developed a three-terminal domain wall motion (DWM) device. We found that its performance was significantly degraded by ion irradiation to the DWM materials under conventional etching conditions with Ar/NH3/CO gas mixture plasma for the devic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c56c50c325ebbda064e551ceb43d9f0
https://doi.org/10.1109/tmag.2014.2325019
https://doi.org/10.1109/tmag.2014.2325019
Autor:
Sadahiko Miura, Hiroki Sato, K. Tokutome, Hiroaki Honjo, Shunsuke Fukami, Naoki Kasai, Michio Murahata, K. Mizunuma, Keizo Kinoshita, Shoji Ikeda, Hideo Ohno
Publikováno v:
Japanese Journal of Applied Physics. 53:103001
We investigate the effect of process-induced damage (PID) caused by reactive ion etching using methanol (Me–OH) gas on the magnetic properties of the CoFeB free layer in a magnetic tunnel junction with a perpendicular easy axis (p-MTJ), and on the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0581d460d0db702d72767058bbf01742
https://doi.org/10.7567/jjap.53.103001
https://doi.org/10.7567/jjap.53.103001
Autor:
Michio Murahata, Hiroaki Honjo, S. Miura, Hideo Ohno, Noboru Sakimura, Tadahiko Sugibayashi, Naoki Kasai, K. Tokutome, Ryusuke Nebashi, Keizo Kinoshita, Kunihiko Ishihara, Shunsuke Fukami
Publikováno v:
Journal of Applied Physics. 115:17B750
We demonstrated read and write characteristics of a three terminal memory device with a perpendicular anisotropy-free layer of a strip of [Co/Ni] and a low-switching perpendicular-anisotropy CoFeB/MgO sensing layer. This new design of the cell result
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eaa8026b2af53e8fdc7580172e5e18b8
https://doi.org/10.1063/1.4868623
https://doi.org/10.1063/1.4868623
Autor:
Naoki Kasai, Hiroaki Honjo, Sadahiko Miura, K. Tokutome, Ryusuke Nebashi, Shunsuke Fukami, Keizo Kinoshita, Shoji Ikeda, Michio Murahata, Hideo Ohno
Publikováno v:
Japanese Journal of Applied Physics. 53:03DF03
The effect of ion irradiation on magnetic domain wall motion (DWM) in a perpendicularly magnetized Co/Ni multilayered film was investigated. The DWM in the Co/Ni multilayered film was sometimes inhibited owing to damage in Co/Ni induced by ion irradi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::665df66a5342d8179fc2bd3669bd8faa
https://doi.org/10.7567/jjap.53.03df03
https://doi.org/10.7567/jjap.53.03df03
Publikováno v:
SPIE Proceedings.
For high-density recording at a wavelength of 690 nm, we developed a phase-change optical disk with a Si reflective layer. We estimated the effect of interference layer by calculating optical properties. The absorption control required for mark edge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb434ee174f71b5c9584cedca5a23756
https://doi.org/10.1117/12.218726
https://doi.org/10.1117/12.218726
Autor:
Masahiro Yanagisawa, Michio Murahata, Masanori Saito, Akinobu Sato, Toshio Tsuno, Yuji Tsukamoto, Fumito Watanabe, H. Yamaguchi, Hiroko Honda
Publikováno v:
Optical Data Storage Topical Meeting.
This paper describes an extremely durable CD-ROM and its reliability. A pit pattern was fabricated through a sol-gel process utilizing a 2P/epoxy work stamper. Excellent stability was guaranteed by a layered structure, such as the SiO2-ZrO2 over coat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::72ff34c9780b5b24ecdb7afd22d42270
https://doi.org/10.1364/ods.1991.mb3
https://doi.org/10.1364/ods.1991.mb3
Autor:
Keizo Kinoshita, Hiroaki Honjo, Shunsuke Fukami, Hideo Sato, Kotaro Mizunuma, Keiichi Tokutome, Michio Murahata, Shoji Ikeda, Sadahiko Miura, Naoki Kasai, Hideo Ohno
Publikováno v:
Japanese Journal of Applied Physics; Oct2014, Vol. 53 Issue 10, p1-1, 1p