Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Michelle E. Bertram"'
Autor:
Penmatcha Pv, Michelle E. Bertram, Shaurya Khanna, Nikhil Suresh, Chow Aa, Sukesh Ram, Timoteo C. Diaz, Thilina Balasooriya, Aashi Gurijala, Peng W, Robert Culbertson, Mohammed Sahal, Christian E. Cornejo, Nicole Herbots, Jandhyala Sv, Karen L. Kavanagh
When different semiconductors are integrated into hetero-junctions, native oxides generate interfacial defects and cause electronic recombination. Two state-of-the-art integration methods, hetero-epitaxy and Direct Wafer Bonding (DWB), require temper
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ccfb2de5c405cc7884d84198fd8c8b7
https://doi.org/10.21203/rs.3.rs-425834/v1
https://doi.org/10.21203/rs.3.rs-425834/v1
Autor:
Michelle E. Bertram, Jack M. Day, Christian E. Cornejo, Robert Culbertson, Karen L. Kavanagh, Ajit Dhamdhere, Franscesca J. Ark, Timoteo C. Diaz, R. Islam, Sukesh Ram, Nicole Herbots, Saaketh Narayan
Publikováno v:
MRS Advances. 3:3403-3411
Analysis of the total surface energy γT and its three components as established by the van Oss-Chaudhury-Good Theory (vOCG) is conducted via Three Liquid Contact Angle Analysis (3LCAA). γT is correlated with the composition of the top monolayers (M
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4917d8f68ccae090bf33ce0b71e1a83c
https://doi.org/10.1557/adv.2018.529
https://doi.org/10.1557/adv.2018.529
Autor:
Michelle E. Bertram, R. Islam, Franscesca J. Ark, Nicole Herbots, Sukesh Ram, Christian E. Cornejo, Harshini L. Thinakaran, Timoteo C. Diaz, Saaketh Narayan, M.W. Mangus, Robert Culbertson, Jack M. Day, Karen L. Kavanagh
Publikováno v:
MRS Advances. 3:3379-3390
The effects of crystal orientation and doping on the surface energy, γT, of native oxides of Si(100) and Si(111) are measured via Three Liquid Contact Angle Analysis (3LCAA) to extract γT, while Ion Beam Analysis (IBA) is used to detect Oxygen. Dur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::575965c3cd9a6e64290089d3c999065f
https://doi.org/10.1557/adv.2018.473
https://doi.org/10.1557/adv.2018.473