Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Micheal D. Kempe"'
Autor:
Raymond J. Wieser, Zelin Zack Li, Stephanie L. Moffitt, Ruben Zabalza, Evan Boucher, Silvana Ayala, Matthew Brown, Xiaohong Gu, Liang Ji, Colleen O'Brien, Adam W. Hauser, Greg S. O'Brien, Xuanji Yu, Roger H. French, Micheal D. Kempe, Jared Tracy, Kausik R. Choudhury, William J. Gambogi, Laura S. Bruckman, Kenneth P. Boyce
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e134fea0111a01b9b259dfe90426edf3
https://doi.org/10.1109/pvsc48317.2022.9938576
https://doi.org/10.1109/pvsc48317.2022.9938576
Autor:
Kenneth P. Boyce, Xiaohong Gu, Greg O'Brien, Colleen O'Brien, Raymond J. Wieser, Matthew Brown, Liang Ji, Stephanie L. Moffitt, Adam W. Hauser, Roger H. French, Kausik R. Choudhury, Evan Boucher, William J. Gambogi, Laura S. Bruckman, Ruben Zabalza, Jared Tracy, Silvana Ayala, Kunal Rath, Micheal D. Kempe
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Assessing photovoltaic module backsheet durability is critical to increasing module lifetime. Lab based accelerating testing has recently failed to predict large scale failures of widely adopted polymeric materials. Field surveyed data is critical to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f3f9a3e5853bf31d71e38294832501e
https://doi.org/10.1109/pvsc43889.2021.9519128
https://doi.org/10.1109/pvsc43889.2021.9519128