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pro vyhledávání: '"Michalas, L."'
The electrical properties of thin TiO2 films have recently been extensively exploited towards enabling a variety for metal-oxide electron devices: unipolar/bipolar semiconductor devices and/or memristors. In such efforts, investigations on the role o
Externí odkaz:
http://arxiv.org/abs/1712.04218
Autor:
Koutsoureli, M., Zevgolatis, A., Saada, S., Mer-Calfati, C., Michalas, L., Papaioannou, G., Bergonzo, P.
Publikováno v:
In Microelectronics Reliability September 2016 64:660-664
Publikováno v:
In Microelectronics Reliability September 2016 64:688-692
Autor:
Michalas, L., Brinciotti, E., Lucibello, A., Gramse, G., Joseph, C.H., Kienberger, F., Proietti, E., Marcelli, R.
Publikováno v:
In Microelectronic Engineering 15 June 2016 159:64-69
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1891-1895
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1911-1915
Autor:
Koutsoureli, M., Adikimenakis, A., Michalas, L., Papandreou, E., Stavrinidis, G., Konstantinidis, G., Georgakilas, A., Papaioannou, G.
Publikováno v:
In Microelectronic Engineering 25 November 2014 130:69-73
Autor:
Jégou, C., Michalas, L., Maroutian, T., Agnus, G., Koutsoureli, M., Papaioannou, G., Largeau, L., Troadec, D., Leuliet, A., Aubert, P., Lecoeur, Ph.
Publikováno v:
In Thin Solid Films 31 July 2014 563:32-35
Publikováno v:
In Microelectronic Engineering February 2012 90:72-75
Publikováno v:
In Thin Solid Films 2009 517(23):6364-6366