Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Michal Odstrčil"'
Autor:
Esther H.R. Tsai, Juliette Billaud, Dario F. Sanchez, Johannes Ihli, Michal Odstrčil, Mirko Holler, Daniel Grolimund, Claire Villevieille, Manuel Guizar-Sicairos
Publikováno v:
iScience, Vol 11, Iss , Pp 356-365 (2019)
Summary: The search for higher performance, improved safety, and lifetime of lithium-ion batteries relies on the understanding of degradation mechanisms. Complementary to methods and studies on primary particles or crystalline structure on bulk mater
Externí odkaz:
https://doaj.org/article/f26fe4509d2040a0898f0dfb66f6cd39
Autor:
Haoyan Lu, Michal Odstrčil, Charles Pooley, Jan Biller, Mikheil Mebonia, Guanze He, Matthew Praeger, Larissa Juschkin, Jeremy Frey, William Brocklesby
Ptychography is a lensless imaging technique that is aberration-free and capable of imaging both the amplitude and the phase of radiation reflected or transmitted from an object using iterative algorithms. Working with extreme ultraviolet (EUV) light
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd2b08903e6c02109e7aa211a54111c5
https://eprints.soton.ac.uk/476707/
https://eprints.soton.ac.uk/476707/
Autor:
Zhen Chen, Yi Jiang, Yu-Tsun Shao, Megan E Holtz, Michal Odstrčil, Manuel Guizar-Sicairos, Isabelle-Mercedes Schulze-Jonack, Steffen Ganschow, Darrell G Schlom, David A Muller
Publikováno v:
Microscopy and Microanalysis. 28:376-378
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b13188ebfbddc4559ae26da4188d26c
https://doi.org/10.1017/s1431927622002240
https://doi.org/10.1017/s1431927622002240
Autor:
Jana Turňová, Michal Odstrčil, Alfio Torrisi, Mesfin Getachew Ayele, Przemyslaw Wachulak, Tomáš Parkman, Henryk Fiedorowicz, Šárka Salačová, Joanna Czwartos, Andrzej Bartnik, Tomasz Fok, Łukasz Węgrzyński
Publikováno v:
Applied Sciences; Volume 7; Issue 6; Pages: 548
Applied Sciences
Applied Sciences
We present our recent results, related to nanoscale imaging in the extreme ultraviolet (EUV) and soft X-ray (SXR) spectral ranges and demonstrate three novel imaging systems recently developed for the purpose of obtaining high spatial resolution imag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a489e107784986ffae09528630fc1331
https://hdl.handle.net/11587/460199
https://hdl.handle.net/11587/460199
Autor:
Denis Rudolf, Klaus Bergmann, Michal Odstrčil, Jan Bußmann, Minjie Dong, Serhiy Danylyuk, Larissa Juschkin
Extreme ultraviolet (EUV) spectroscopy is a powerful tool for studying fundamental processes in plasmas as well as for spectral characterization of EUV light sources and EUV optics. However, a simultaneous measurement covering a broadband spectral ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c009699fd9508ce47cca5a4ea89f2ba9
https://publica.fraunhofer.de/handle/publica/240091
https://publica.fraunhofer.de/handle/publica/240091
Publikováno v:
Nature Communications, Vol 11, Iss 1, Pp 1-10 (2020)
With conventional scanning transmission electron microscopy, some sensitive materials are difficult to image with atomic resolution. The authors present a method of mixed-state electron ptychography that enables picometer precision with fast acquisit
Externí odkaz:
https://doaj.org/article/6335039a21c2477fb747de0d415bf2ba
Autor:
Michal Odstrcil, Mirko Holler, Jörg Raabe, Alessandro Sepe, Xiaoyuan Sheng, Silvia Vignolini, Christian G. Schroer, Manuel Guizar-Sicairos
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
Radiation induced sample deformation can be a limiting factor for X-ray imaging resolution at the nanoscale. The authors report a tomographic model that estimates and accounts for morphological changes during data acquisition and enables reconstructi
Externí odkaz:
https://doaj.org/article/59a659e159a448c381cddbdcd4dc4fc8
Autor:
Mirko Holler, Jörg Raab, Oliver Bunk, Ana Diaz, Elisabeth Müller, Roberto Dinapoli, Michal Odstrcil, Esther H. R. Tsai, Manuel Guizar-Sicairos, Gabriel Aeppli
Publikováno v:
CHIMIA, Vol 72, Iss 5 (2018)
Externí odkaz:
https://doaj.org/article/b092624e714b473c8cae3882014d6caa