Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Michal Minarik"'
Publikováno v:
Advances in Electrical and Electronic Engineering, Vol 20, Iss 1, Pp 86-94 (2022)
This paper investigates a degradation of three types of automotive power MOSFETs through repetitive Unclamped Inductive Switching (UIS) test typically used to evaluate the avalanche robustness of power devices. It is not uncommon in switching applica
Externí odkaz:
https://doaj.org/article/f1406e2478db45edb25ddc30287ff739
Publikováno v:
Advances in Electrical and Electronic Engineering, Vol 19, Iss 4, Pp 361-368 (2021)
On-die testing can accelerate development of semiconductor devices, but poses certain challenges related to high frequency and high current switching. This paper describes design and development of a tester for double-pulse switching test and measure
Externí odkaz:
https://doaj.org/article/d2924298673f4413afdd8ee3d41699ed
Autor:
Juraj Marek, Jozef Kozarik, Michal Minarik, Aleš Chvála, Matej Matus, Martin Donoval, Lubica Stuchlikova, Martin Weis
Publikováno v:
Materials, Vol 15, Iss 22, p 8230 (2022)
Silicon carbide (SiC) has been envisioned as an almost ideal material for power electronic devices; however, device reliability is still a great challenge. Here we investigate the reliability of commercial 1.2-kV 4H-SiC MOSFETs under repetitive uncla
Externí odkaz:
https://doaj.org/article/084838def2234127b0662c6427bdd9da
Publikováno v:
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d5c83b12cfce9508036a633ac9f2eb2
https://doi.org/10.1109/asdam55965.2022.9966790
https://doi.org/10.1109/asdam55965.2022.9966790