Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Michail Noltsis"'
Autor:
Dimitrios Soudris, Michail Noltsis, Francky Catthoor, Eleni Maragkoudaki, Dimitrios Rodopoulos
Publikováno v:
PATMOS
© 2018 Elsevier B.V. Application requirements along with the unceasing demand for ever-higher scale of device integration, has driven technology towards an aggressive downscaling of transistor dimensions. This development is confronted with variabil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::666191f5bbdd2098df3ec5920041cc2f
https://doi.org/10.1016/j.vlsi.2018.03.016
https://doi.org/10.1016/j.vlsi.2018.03.016
Autor:
Michail Noltsis, Per Gunnar Kjeldsberg, Yahya H. Yassin, Dimitrios Soudris, Nikolaos Zombakis, Francky Catthoor
Publikováno v:
System-Scenario-based Design Principles and Applications ISBN: 9783030203429
The objective of the present chapter is to perform synergies among system scenario methodologies and processor mapping with emphasis on DVFS. First, we exploit the system scenario methodology and combine it with a DVFS-aware scheduler to ensure timin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::292b1b5caaa9446353d31912954ec7bb
https://doi.org/10.1007/978-3-030-20343-6_4
https://doi.org/10.1007/978-3-030-20343-6_4
Autor:
Francky Catthoor, Dimitrios Rodopoulos, Nikolaos Zompakis, Dimitrios Soudris, Michail Noltsis
Publikováno v:
System-Scenario-based Design Principles and Applications ISBN: 9783030203429
The integration scale in one chip in the last decades has improved dramatically, highlighting in the same time critical reliability issues. Run-time mechanisms that correct errors in real-time deal ensure the operation reliability, availability, and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ca336b80b770f5f0fcbece1930bd448
https://doi.org/10.1007/978-3-030-20343-6_7
https://doi.org/10.1007/978-3-030-20343-6_7
Autor:
Michail Noltsis, Nikolaos Zompakis, Francky Catthoor, Dimitrios Rodopoulos, Dimitrios Soudris
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 23:1-23
Modern microprocessors contain a variety of mechanisms used to mitigate errors in the logic and memory, referred to as Reliability, Availability, and Serviceability (RAS) techniques. Many of these techniques, such as component disabling, come at a pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f94085aa9f60e85b2cac52f632268d66
https://doi.org/10.1145/3152158
https://doi.org/10.1145/3152158
Publikováno v:
PATMOS
In the era of nanoelectronic circuits, temperature largely affects reliability and static power consumption of systems. In fact, temperature control in modern circuits is considered as a crucial system function, along with low-power operation. To thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b99d6611be5f3059a66ff27084fc5d6
https://doi.org/10.1109/patmos.2019.8862032
https://doi.org/10.1109/patmos.2019.8862032
Autor:
William Fornaciari, Antoni Portero, Alessandro Bacchini, Zacharias Hadjilambrou, Fritsch Agnes, Martin Golasowski, Michail Noltsis, Francky Catthoor, Panayiotis Englezakis, Stepan Kuchar, Jiri Sevcik, Giuseppe Massari, Radim Vavrik, Vít Vondrák, Hans Cappelle, Nikolaos Zompakis, Simone Libutti, Panagiota Nikolaou, Dimitrios Soudris, Yiannakis Sazeides, Chrysostomos Nicopoulos, Federico Sassi, Lorena Ndreu
Publikováno v:
Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms ISBN: 9783319919614
The goal of the HARPA solution is to overcome the performance variability (PV) by enabling next-generation embedded and high-performance platforms using heterogeneous many-core processors to provide cost-effectively dependable performance: the correc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::505601376adf94b82a3e1baa09ea9ddd
http://hdl.handle.net/11311/1066938
http://hdl.handle.net/11311/1066938
Publikováno v:
Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms ISBN: 9783319919614
As semiconductor technology nodes approach deca-nanometer dimensions, several phenomena threaten the binary correctness of a digital processor. Computer architectures typically enhance their designs with reliability, availability, and serviceability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08300d0974891c9f333883a9e971fc90
https://doi.org/10.1007/978-3-319-91962-1_7
https://doi.org/10.1007/978-3-319-91962-1_7
Autor:
Dimitrios Rodopoulos, Nikolaos Zompakis, Michail Noltsis, Francky Catthoor, Dimitrios Soudris
Publikováno v:
Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms ISBN: 9783319919614
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c597e1f03330f62d5c3a644a39902fc
https://doi.org/10.1007/978-3-319-91962-1_6
https://doi.org/10.1007/978-3-319-91962-1_6
Energy Efficient Adaptive Approach for Dependable Performance in the presence of Timing Interference
Autor:
Michail Noltsis, Nikolaos Zompakis, Dimitrios Rodopoulos, Dimitrios Soudris, Francky Catthoor
Publikováno v:
ACM Great Lakes Symposium on VLSI
Silicon design miniaturization has dramatically improved the integration scale in one chip, highlighting in the same time reliability issues. Error-correction mechanisms deal with these issues ensuring the operation Reliability, Availability and Serv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6cac59d997e9e64db8a46b90f2770cb
https://doi.org/10.1145/3060403.3060449
https://doi.org/10.1145/3060403.3060449
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 14:704-714
Bias Temperature Instability (BTI) is a major concern for the reliability of decameter to nanometer devices. Older modeling approaches fail to capture time-dependent device variability or maintain a crude view of the device's stress. Previously, a tw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aeb95cbd3492287b098a0266b1daa36f
https://doi.org/10.1109/tdmr.2014.2314356
https://doi.org/10.1109/tdmr.2014.2314356