Zobrazeno 1 - 10
of 69
pro vyhledávání: '"Michael Wojcik"'
Autor:
Albert Macrander, Xianbo Shi, Walan Grizzoli, Xianrong Huang, Nino Pereira, Michael Wojcik, Lahsen Assoufid
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 3, Pp 508-516 (2024)
Coherent X-ray imaging is an active field at synchrotron sources. The images rely on the available coherent flux over a limited field of view. At many synchrotron beamlines a double-crystal monochromator (DCM) is employed in a standard nondispersive
Externí odkaz:
https://doaj.org/article/82c49faeb1da4f6686b11b9b5c65c389
Publikováno v:
Nature Communications, Vol 14, Iss 1, Pp 1-13 (2023)
Abstract Visualizing surface-supported and buried planar mesoscale structures, such as nanoelectronics, ultrathin-film quantum dots, photovoltaics, and heterogeneous catalysts, often requires high-resolution X-ray imaging and scattering. Here, we dis
Externí odkaz:
https://doaj.org/article/731f9ae430a441cfbf92dacf48c55881
Publikováno v:
Journal of Imaging, Vol 7, Iss 12, p 249 (2021)
Near-field X-ray speckle tracking has been used in phase-contrast imaging and tomography as an emerging technique, providing higher contrast images than traditional absorption radiography. Most reported methods use sandpaper or membrane filters as sp
Externí odkaz:
https://doaj.org/article/f709734edd4d49138be9b0d8c604e0f8
Autor:
Xianbo Shi, Zhi Qiao, Luca Rebuffi, Michael Wojcik, Matthew Highland, Matthew G. Frith, Ross Harder, Deming Shu, Sheikh Mashrafi, Jayson Anton, Steven Kearney, Max Wyman, Lahsen Assoufid
Publikováno v:
Synchrotron Radiation News. :1-6
To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. However, finding the geometry by trial and error is a time-consuming and oft
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5d39f7a33ce066c3f32b06adbb38fe7
http://arxiv.org/abs/2208.07873
http://arxiv.org/abs/2208.07873
Autor:
Sam Laxer, Karim S. Karim, Michael G. Farrier, Christopher C. Scott, Antonino Miceli, Parmesh Ravi, Michael Wojcik, Peter Kenesei, Yunzhe Li
Publikováno v:
Journal of Synchrotron Radiation. 28:1081-1089
The objective of this work was to fabricate and characterize a new X-ray imaging detector with micrometre-scale pixel dimensions (7.8 µm) and high detection efficiency for hard X-ray energies above 20 keV. A key technology component consists of a mo
Autor:
Barry Lai, Zhonghou Cai, Michael Wojcik, Oliver Cossairt, Fabricio Marin, Christian Roehrig, Curt Preissner, Yi Jiang, Junjing Deng, Stefan Vogt, Yudong Yao, Jeffrey A. Klug, Youssef S. G. Nashed
Publikováno v:
Journal of Synchrotron Radiation
Broadband X-ray ptychography is developed based on the multi-wavelength reconstruction method and is systematically demonstrated in both simulation and experiment. In addition, a combined reconstruction approach is proposed to further increase the pt
Autor:
David Troadec, Vincent De Andrade, Doga Gursoy, Cassandra Arico, Sunil Bean, Deming Shu, Tim Mooney, Saliha Ouendi, Patrice Simon, Michael Wojcik, Christophe Lethien, Francesco De Carlo, Alex Deriy, Kamel Fezzaa, Kevin M. Peterson, Kenan Li, Prabhat Kc, Viktor Nikitin, Sajid Ali
Publikováno v:
Advanced Materials
Advanced Materials, 2021, 33 (21), pp.2008653. ⟨10.1002/adma.202008653⟩
Advanced Materials, 2021, 33 (21), pp.2008653. ⟨10.1002/adma.202008653⟩
In the last decade, transmission X-ray microscopes (TXMs) have come into operation in most of the synchrotrons worldwide. They have proven to be outstanding tools for non-invasive ex and in situ 3D characterization of materials at the nanoscale acros
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e873f91d4791fc969dc72958712e97ac
https://hal.science/hal-03545058
https://hal.science/hal-03545058
Autor:
Yekan Wang, Michael Evan Liao, Kenny Huynh, William Olsen, James C Gallagher, Travis J. Anderson, Xianrong Huang, Michael Wojcik, Mark S. Goorsky
Publikováno v:
ECS Meeting Abstracts. :1309-1309
In this work, the effects of the substrate defects on the reverse leakage behavior of vertical GaN Schottky and p-i-n diodes are investigated. A direct connection between the reverse leakage behavior of GaN based vertical devices and the defect chara
Autor:
Michael Wojcik, Junjing Deng, Stefan Vogt, Jeffrey A. Klug, Yudong Yao, Christian Roehrig, Barry Lai, Zhonghou Cai, Curt Preissner, Yi Jiang
Publikováno v:
OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP).
X-ray ptychography has gained tremendous success in providing quantitative high-resolution imaging for extended samples. Here we report on recent developments in ptychography imaging techniques and the improvement of reconstruction methods to increas