Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Michael W. Kiefer"'
Publikováno v:
SPIE Proceedings.
A multispectral normalization processing system has been developed to produce percent reflectance maps from multispectral imagery (MSI) in the .4 to 2.5 micron wavelength range. It is adaptive to multiple spatial resolutions, supporting resolutions i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67c15ecc41552ce4e79fed6ef7f5102d
https://doi.org/10.1117/12.243221
https://doi.org/10.1117/12.243221
