Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Michael Tartz"'
Autor:
Carsten Bundesmann, Christoph Eichhorn, Horst Neumann, Frank Scholze, Daniel Spemann, Michael Tartz, Hans J. Leiter, Roman Y. Gnizdor, Fabrizio Scortecci
Publikováno v:
EPJ Techniques and Instrumentation, Vol 9, Iss 1, Pp 1-23 (2022)
Abstract The lifetime of electric propulsion (EP) thrusters depends particularly on the erosion characteristics of operation relevant components, for instance, the grid hole erosion of gridded ion thrusters or the channel wall erosion of Hall effect
Externí odkaz:
https://doaj.org/article/c106d50703a84017a5f5ac54de82cdeb
Autor:
Frank Scholze, Michael Tartz, Hans Leiter, Fabrizio Scortecci, Horst Neumann, Carsten Bundesmann
Publikováno v:
Journal of Propulsion and Power. 27:532-537
hole diameter, distance between holes, or grid shape. These parameters are also measured in situ with a telemicroscope for high-resolution optical imaging and a triangular laser head for surface profile scanning. The distance between grid surface and
Publikováno v:
The European Physical Journal D. 61:587-592
The sputter yield is an important material parameter not only for various surface treatment techniques, but also for electric spacecraft propulsion. Many satellite or thruster components might be subject of erosion due to energetic and/or related sec
Publikováno v:
Contributions to Plasma Physics. 47:487-497
Ion thrusters or broad beam ion sources are widely used in electrostatic space propulsion and in high-end surface modification processes. A short historical review of the roots of electric space propulsion is given. In the following, we introduce the
Autor:
Michael Tartz, Horst Neumann
Publikováno v:
Plasma Processes and Polymers. 4:S633-S636
We performed angle and energy dependent sputter yield measurements of various prospective carbon ion thruster grid materials under xenon ion incidence in the energy range 200–1 400 eV and at normal and oblique incidence up to 70°. Materials invest
Publikováno v:
Thin Solid Films. 459:106-110
Ion beam sputtering i.e. the removal of material from a surface due to the impact of energetic ions or atoms, is an inherent part of numerous surface processing techniques. Due to self-organization caused by the process of low-energy ion beam erosion
Publikováno v:
Surface and Coatings Technology. :34-38
In broad-beam ion sources an inhomogeneous plasma distribution has a strong effect on the maximum extractable ion current, the broad-beam profile and the grid lifetime. Two methods for the determination of the plasma density profile at the sheath are
Publikováno v:
Plasma Sources Science and Technology. 7:252-267
We characterize the performance of a modular broad beam ion source by energy resolved mass spectrometry and beam profile measurements. Using the same source housing and grid system, we performed our experiments powering the source with a hot filament
Publikováno v:
Surface and Coatings Technology. 97:504-509
Generation of an ion beam in a broad-beam ion source depends on a large number of parameters. Its comprehensive experimental characterization is therefore very expensive and time-consuming. Consequently, in designing broad-beam ion sources, support u
Publikováno v:
Review of Scientific Instruments. 73:928-930
Low-energy broad-beam ion sources cover a wide range of applications. Geometrical perturbations of the axial-symmetric extraction channels by off-axis shifts of the accelerator grid holes give rise to an ion beamlet tilt which under certain condition