Zobrazeno 1 - 10
of 73
pro vyhledávání: '"Michael Störmer"'
Autor:
Gnanavel Vaidhyanathan Krishnamurthy, Manohar Chirumamilla, Surya Snata Rout, Kaline P. Furlan, Tobias Krekeler, Martin Ritter, Hans-Werner Becker, Alexander Yu Petrov, Manfred Eich, Michael Störmer
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Abstract The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and lo
Externí odkaz:
https://doaj.org/article/f68b42314a7c4beb906fa0046e953680
Autor:
Manohar Chirumamilla, Gnanavel Vaidhyanathan Krishnamurthy, Katrin Knopp, Tobias Krekeler, Matthias Graf, Dirk Jalas, Martin Ritter, Michael Störmer, Alexander Yu Petrov, Manfred Eich
Publikováno v:
Scientific Reports, Vol 9, Iss 1, Pp 1-11 (2019)
Abstract High temperature stable selective emitters can significantly increase efficiency and radiative power in thermophotovoltaic (TPV) systems. However, optical properties of structured emitters reported so far degrade at temperatures approaching
Externí odkaz:
https://doaj.org/article/065a0eaa0973406fb5364bc0a135153b
Autor:
Maria del Rosario Silva Campos, Carsten Blawert, Nico Scharnagl, Michael Störmer, Mikhail L. Zheludkevich
Publikováno v:
Materials, Vol 15, Iss 4, p 1301 (2022)
Typically, steel is protected from corrosion by employing sacrificial anodes or coatings based on Zn, Mg, Al or Cd. However, stricter environmental regulations require new environmentally friendly alternatives to replace Cd. Traditionally, Al-based a
Externí odkaz:
https://doaj.org/article/56d30b9b36c043ab8a3c351558b79619
Autor:
Mahima Arya, Ankita Ganguly, Gnanavel V. Krishnamurthy, Surya S. Rout, Leonid Gurevich, Tobias Krekeler, Martin Ritter, Kjeld Pedersen, Michael Störmer, Alexander Yu Petrov, Manfred Eich, Manohar Chirumamilla
Publikováno v:
Arya, M.; Ganguly, A.; Krishnamurthy, G.V.; Rout, S.S.; Gurevich, L.; Krekeler, T.; Ritter, M.; Pedersen, K.; Störmer, M.; Yu Petrov, A.; Eich, M.; Chirumamilla, M.: Which factor determines the optical losses in refractory tungsten thin films at high temperatures?. In: Applied Surface Science. Vol. 588 (2022) 152927. (DOI: /10.1016/j.apsusc.2022.152927)
Arya, M, Ganguly, A, Krishnamurthy, G V, Rout, S S, Gurevich, L, Krekeler, T, Ritter, M, Pedersen, K, Störmer, M, Yu Petrov, A, Eich, M & Chirumamilla, M 2022, ' Which factor determines the optical losses in refractory tungsten thin films at high temperatures? ', Applied Surface Science, vol. 588, 152927 . https://doi.org/10.1016/j.apsusc.2022.152927
Applied Surface Science 588: 152927 (2022-06-30)
Arya, M, Ganguly, A, Krishnamurthy, G V, Rout, S S, Gurevich, L, Krekeler, T, Ritter, M, Pedersen, K, Störmer, M, Yu Petrov, A, Eich, M & Chirumamilla, M 2022, ' Which factor determines the optical losses in refractory tungsten thin films at high temperatures? ', Applied Surface Science, vol. 588, 152927 . https://doi.org/10.1016/j.apsusc.2022.152927
Applied Surface Science 588: 152927 (2022-06-30)
Refractory tungsten (W) plays an important role in high temperature photonic/plasmonic applications. Previously room temperature bulk single/poly-crystalline optical constants were extensively used to calculate the optical properties of W nanostructu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53b8081c88ff9f5ee2805437e3910524
https://publications.hereon.de/id/50516
https://publications.hereon.de/id/50516
Autor:
Martin Ritter, Duncan S. Sutherland, Gnanavel Vaidhyanathan Krishnamurthy, Alexander Petrov, Kjeld Møller Pedersen, S. S. Rout, Manohar Chirumamilla, Sergey I. Bozhevolnyi, Ankita Ganguly, Manfred Eich, Tobias Krekeler, Mahima Arya, Michael Störmer
Publikováno v:
Krekeler, T, Rout, S S, Krishnamurthy, G V, Störmer, M, Arya, M, Ganguly, A, Sutherland, D S, Bozhevolnyi, S I, Ritter, M, Pedersen, K, Petrov, A Y, Eich, M & Chirumamilla, M 2021, ' Unprecedented Thermal Stability of Plasmonic Titanium Nitride Films up to 1400 °C ', Advanced Optical Materials, vol. 9, no. 16, 2100323 . https://doi.org/10.1002/adom.202100323
Krekeler, T.; Rout, S.S.; Krishnamurthy, G.V.; Störmer, M.; Arya, M.; Ganguly, A.; Sutherland, D.S.; Bozhevolnyi, S.I.; Ritter, M.; Pedersen, K.; Petrov, A.Y.; Eich, M.; Chirumamilla, M.: Unprecedented Thermal Stability of Plasmonic Titanium Nitride Films up to 1400 °C. In: Advanced Optical Materials. Vol. 9 (2021) 16, 2100323. (DOI: /10.1002/adom.202100323)
Krekeler, T, S. Rout, S, V. Krishnamurthy, G, Störmer, M, Arya, M, Ganguly, A, S. Sutherland, D, i. Bozhevolnyi, S, Ritter, M, Pedersen, K, Yu Petrov, A, Eich, M & Chirumamilla, M 2021, ' Unprecedented Thermal Stability of Plasmonic Titanium Nitride Films up to 1400 °C ', Advanced Optical Materials, vol. 9, no. 16, 2100323 . https://doi.org/10.1002/adom.202100323
Krekeler, T, Rout, S S, Krishnamurthy, G V, Störmer, M, Arya, M, Ganguly, A, Sutherland, D S, Bozhevolnyi, S I, Ritter, M, Pedersen, K, Petrov, A Y, Eich, M & Chirumamilla, M 2021, ' Unprecedented thermal stability of plasmonic titanium nitride films up to 1400 °C ', Advanced Optical Materials, vol. 9, no. 16, 2100323 . https://doi.org/10.1002/adom.202100323
Advanced Optical Materials 9 (16): 2100323 (2021-08-18)
Krekeler, T.; Rout, S.S.; Krishnamurthy, G.V.; Störmer, M.; Arya, M.; Ganguly, A.; Sutherland, D.S.; Bozhevolnyi, S.I.; Ritter, M.; Pedersen, K.; Petrov, A.Y.; Eich, M.; Chirumamilla, M.: Unprecedented Thermal Stability of Plasmonic Titanium Nitride Films up to 1400 °C. In: Advanced Optical Materials. Vol. 9 (2021) 16, 2100323. (DOI: /10.1002/adom.202100323)
Krekeler, T, S. Rout, S, V. Krishnamurthy, G, Störmer, M, Arya, M, Ganguly, A, S. Sutherland, D, i. Bozhevolnyi, S, Ritter, M, Pedersen, K, Yu Petrov, A, Eich, M & Chirumamilla, M 2021, ' Unprecedented Thermal Stability of Plasmonic Titanium Nitride Films up to 1400 °C ', Advanced Optical Materials, vol. 9, no. 16, 2100323 . https://doi.org/10.1002/adom.202100323
Krekeler, T, Rout, S S, Krishnamurthy, G V, Störmer, M, Arya, M, Ganguly, A, Sutherland, D S, Bozhevolnyi, S I, Ritter, M, Pedersen, K, Petrov, A Y, Eich, M & Chirumamilla, M 2021, ' Unprecedented thermal stability of plasmonic titanium nitride films up to 1400 °C ', Advanced Optical Materials, vol. 9, no. 16, 2100323 . https://doi.org/10.1002/adom.202100323
Advanced Optical Materials 9 (16): 2100323 (2021-08-18)
Titanium nitride (TiN) has emerged as one of the most promising refractory materials for plasmonic and photonic applications at high temperatures due to its prominent optical properties along with mechanical and thermal stability. From a high tempera
Autor:
Gnanavel Vaidhyanathan Krishnamurthy, Michael Störmer, Mahima Arya, Alexander Yu. Petrov, Manohar Chirumamilla, S. S. Rout, Ankita Ganguly, Martin Ritter, Manfred Eich, Tobias Krekeler
Publikováno v:
Technische Universität Hamburg
We measure and compare the optical properties of thin refractory metal films (TiN, W, Mo and Ir) at temperatures up to 1000 °C. In-situ ellipsometry is used to measure the optical constants. Refractory metals show long-term structural stability at 1
Autor:
S. S. Rout, Manfred Eich, Tobias Krekeler, Kaline Pagnan Furlan, Gnanavel Vaidhyanathan Krishnamurthy, Michael Störmer, Hans Werner Becker, Manohar Chirumamilla, Martin Ritter, Alexander Petrov
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Scientific Reports 11 (1): 3330 (2021-02-08)
Krishnamurthy, G.V.; Chirumamilla, M.; Snata Rout, S.; P. Furlan, K.; Krekeler, T.; Ritter, M.; Becker, H.; Petrov, A.; Eich, M.; Störmer, M.: Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C. In: Scientific Reports. Vol. 11 (2021) 1, 3330 . (DOI: /10.1038/s41598-021-82821-0)
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Scientific Reports 11 (1): 3330 (2021-02-08)
Krishnamurthy, G.V.; Chirumamilla, M.; Snata Rout, S.; P. Furlan, K.; Krekeler, T.; Ritter, M.; Becker, H.; Petrov, A.; Eich, M.; Störmer, M.: Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C. In: Scientific Reports. Vol. 11 (2021) 1, 3330 . (DOI: /10.1038/s41598-021-82821-0)
The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO2 are ideal due to their high melting points and low vapor p
Publikováno v:
Journal of Synchrotron Radiation
Störmer, M.; Siewert, F.; Horstmann, C.; Buchheim, J.; Gwalt, G.: Coatings for FEL optics: preparation and characterization of B4C and Pt. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 116-122. (DOI: /10.1107/S1600577517016095)
Störmer, M.; Siewert, F.; Horstmann, C.; Buchheim, J.; Gwalt, G.: Coatings for FEL optics: preparation and characterization of B4C and Pt. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 116-122. (DOI: /10.1107/S1600577517016095)
Boron carbide and platinum are two suitable coating materials for X-ray mirrors at free-electron lasers worldwide. The achieved thickness uniformity for boron carbide is less than 1 nm peak-to-valley over 1500 mm mirror length.
Large X-ray mirro
Large X-ray mirro
Autor:
Igor Alexandrovich Makhotkin, Jaromír Chalupský, Dorota Klinger, Ryszard Sobierajski, Libor Juha, Marek Jurek, Elke Plönjes, Iwanna Jacyna, Karel Saksl, Sebastian Strobel, Michael Störmer, Frank Siewert, Kai Tiedtke, Eric Louis, Barbara Keitel, Igor Milov, Věra Hájková, Tobias Mey, Laurent Nittler, R.A. Loch, Gosse de Vries, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Y. Syryanyy, Tomáš Burian, Han Kwang Nienhuys, Hartmut Enkisch, Grzegorz Gwalt, Bart Faatz, V. Vozda, Robbert Wilhelmus Elisabeth van de Kruijs, Frank Scholze
Publikováno v:
Journal of synchrotron radiation 25(1), 77-84 (2018). doi:10.1107/S1600577517017362
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of synchrotron radiation 25(1), 77 - 84 (2018). doi:10.1107/S1600577517017362
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
Autor:
Dorota Klinger, Marek Jurek, Igor Alexandrovich Makhotkin, Karel Saksl, Michael Störmer, Jerzy B. Pelka, Eric Louis, Sven Toleikis, Vojtech Vozda, Marion Kuhlmann, Iwanna Jacyna, Tomáš Burian, Siegfried Schreiber, Sebastian Strobel, Jaromír Chalupský, Hartmut Enkisch, Mabel Ruiz-Lopez, Frank Siewert, Barbara Keitel, Thomas Wodzinski, Martin Hermann, Vera Hájková, R.A. Loch, Gosse de Vries, Libor Juha, Elke Plönjes, Kai Tiedtke, Tobias Mey, Ryszard Sobierajski, Frank Scholze
Publikováno v:
Optics Damage and Materials Processing by EUV/X-ray Radiation VII.
An accurate transmission measurement of thin foils (usually made of elemental metals and/or semiconductors), which routinely are used as attenuators in soft x-ray beamlines, end-stations and instruments, represents a long standing problem over the wi