Zobrazeno 1 - 10
of 88
pro vyhledávání: '"Michael S Altman"'
Publikováno v:
New Journal of Physics, Vol 19, Iss 1, p 013024 (2017)
Electron intensity versus energy curves from the ordered substitutional BiCu _2 (111)-surface alloy, obtained with low energy electron microscopy (LEEM), show distinct unexpected intensity dips under normal incidence conditions. The dips above 10 eV
Externí odkaz:
https://doaj.org/article/3142807084e8413583adc662d91d435a
Autor:
Xin Li, Guilin Wu, Leining Zhang, Deping Huang, Yunqing Li, Ruiqi Zhang, Meng Li, Lin Zhu, Jing Guo, Tianlin Huang, Jun Shen, Xingzhan Wei, Ka Man Yu, Jichen Dong, Michael S. Altman, Rodney S. Ruoff, Yinwu Duan, Jie Yu, Zhujun Wang, Xiaoxu Huang, Feng Ding, Haofei Shi, Wenxin Tang
Publikováno v:
Nature Communications, Vol 13, Iss 1, Pp 1-8 (2022)
The heteroepitaxial growth of crystalline 2D materials is usually based on single-crystal substrates. Here, the authors demonstrate that single-crystal graphene and hexagonal boron nitride films can be successfully grown on wafer-scale copper foils w
Externí odkaz:
https://doaj.org/article/d168568c1ca4413f926f51fa3d4e34a5
Autor:
Xuan Tan Nguyen, Michael S. Altman
Publikováno v:
Ultramicroscopy. :113751
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::baa0c2616a3a9c434a9f31cf143101cb
https://doi.org/10.1016/j.ultramic.2023.113751
https://doi.org/10.1016/j.ultramic.2023.113751
Autor:
Xin Li, Guilin Wu, Leining Zhang, Deping Huang, Yunqing Li, Ruiqi Zhang, Meng Li, Lin Zhu, Jing Guo, Tianlin Huang, Jun Shen, Xingzhan Wei, Ka Man Yu, Jichen Dong, Michael S. Altman, Rodney S. Ruoff, Yinwu Duan, Jie Yu, Zhujun Wang, Xiaoxu Huang, Feng Ding, Haofei Shi, Wenxin Tang
Publikováno v:
Nature communications. 13(1)
The use of single-crystal substrates as templates for the epitaxial growth of single-crystal overlayers has been a primary principle of materials epitaxy for more than 70 years. Here we report our finding that, though counterintuitive, single-crystal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0acfec8ea72129dfe73bb5968cc2467
https://pubmed.ncbi.nlm.nih.gov/35365650
https://pubmed.ncbi.nlm.nih.gov/35365650
Publikováno v:
Ultramicroscopy. 200:160-168
We present the extended Fourier Optics (FO) approach for modeling image formation in aberration-corrected low energy electron microscopy (ac-LEEM). The FO formalism is also generalized for image simulations of one or two-dimensional objects in ac and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a243bf1b77956b735db4a95722332f76
https://doi.org/10.1016/j.ultramic.2019.01.015
https://doi.org/10.1016/j.ultramic.2019.01.015
Autor:
Zhengtang Luo, Zhi Ping Xu, Ruizhe Wu, Qicheng Zhang, Xuewu Ou, Yao Ding, Michael S. Altman, Wen-Di Li, Zhouyang Zhu, Ke Zhou, Minghao Zhuang, Ka Man Yu
Publikováno v:
Chemistry of Materials. 31:2555-2562
We demonstrate a new concept of edge-epitaxial growth that enables the van der Waals (vdWs) epitaxial graphene growth on different Cu facets. This approach simply entails turning off hydrogen during the nucleation stage of the atmospheric pressure ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddb77389638f9419e027b6adb4e079cc
https://doi.org/10.1021/acs.chemmater.9b00147
https://doi.org/10.1021/acs.chemmater.9b00147
Autor:
Marcella Iannuzzi, Michael S. Altman, Jürg Osterwalder, Thomas Greber, Adrian Hemmi, Zichun Miao, Huanyao Cun, Yasmine S. Al-Hamdani
The production of high-quality two-dimensional (2D) materials is essential for the ultimate performance of single layers and their hybrids. Hexagonal boron nitride (h-BN) is foreseen to become the key 2D hybrid and packaging material since it is insu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd36ac5b58885a865cf204eb95edcc92
https://www.zora.uzh.ch/id/eprint/195328/
https://www.zora.uzh.ch/id/eprint/195328/
Publikováno v:
Physical Review B. 101
The correlation between structure and glass formability in glassy systems is a long-standing puzzle. To solve this puzzle, many descriptors based on the short-range order (SRO) have been proposed. Here we show that the SRO, however, offers little hel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c31b9baa65129c7ac1be528775a0f41b
https://doi.org/10.1103/physrevb.101.214104
https://doi.org/10.1103/physrevb.101.214104
Autor:
R.M. Tromp, Michael S. Altman
Publikováno v:
Ultramicroscopy. 183:2-7
Accurately measuring defocus in cathode lens instruments (Low Energy Electron Microscopy - LEEM, and Photo Electron Emission Microscopy - PEEM) is a pre-requisite for quantitative image analysis using Fourier Optics (FO) or Contrast Transfer Function
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::68cf0cfb24c7e15887c8348a93f42663
https://doi.org/10.1016/j.ultramic.2017.01.021
https://doi.org/10.1016/j.ultramic.2017.01.021
Publikováno v:
Ultramicroscopy. 225:113284
s We present experimental observations of high order phase contrast in aberration corrected low energy electron microscopy (AC-LEEM). Phase contrast produced by atomic steps on a Ag (111) surface exhibits prominent high order interference fringes, wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::91aa24381831a52e60d6db447a9091b7
https://doi.org/10.1016/j.ultramic.2021.113284
https://doi.org/10.1016/j.ultramic.2021.113284