Zobrazeno 1 - 10
of 51
pro vyhledávání: '"Michael Quinten"'
Autor:
Michael Quinten, Faiza Houta
Publikováno v:
PhotonicsViews. 18:52-54
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1b6fe42dd6d432c8a329ed1c3510f5f
https://doi.org/10.1002/phvs.202100025
https://doi.org/10.1002/phvs.202100025
Autor:
Michael Quinten
Publikováno v:
PhotonicsViews. 16:68-71
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff5476e1a98b930db94c84d8f4fe2ffe
https://doi.org/10.1002/phvs.201900028
https://doi.org/10.1002/phvs.201900028
Autor:
Michael Quinten
Publikováno v:
tm - Technisches Messen. 86:345-349
Zusammenfassung Die optische Bestimmung der Dicke transparenter Objekte oder dicker transparenter Schichten kann ziemlich einfach mit einem chromatisch-konfokalen Sensor durchgeführt werden. Die Dicke erhält man als Differenz zweier Distanzpeaks mu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::317afae604590344f9aaa4f33efc8d7a
https://doi.org/10.1515/teme-2019-0059
https://doi.org/10.1515/teme-2019-0059
Autor:
Michael Quinten
Publikováno v:
Optik & Photonik. 13:46-48
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1fedd7d2279159e02be54e0731767940
https://doi.org/10.1002/opph.201800021
https://doi.org/10.1002/opph.201800021
Autor:
Michael Quinten
Publikováno v:
SN Applied Sciences. 1
Thin film thickness determination with a reflectometer is a fast and pretty cheap method that can be applied on many thin and thick films that are transparent or semitransparent in the considered spectral range. For evaluation of the reflectance spec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1cd7911090fec99e99546fb1cede6a3
https://doi.org/10.1007/s42452-019-0866-9
https://doi.org/10.1007/s42452-019-0866-9
Autor:
Michael Quinten
Publikováno v:
Springer Series in Measurement Science and Technology ISBN: 9783030294533
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1327803e9abf628694a312c5309e8fd
https://doi.org/10.1007/978-3-030-29454-0
https://doi.org/10.1007/978-3-030-29454-0
Autor:
Michael Quinten
Publikováno v:
A Practical Guide to Surface Metrology ISBN: 9783030294533
This Chapter is concerned with methods for characterization and measurement of technical surfaces using tactile methods. It comprises the classical stylus tip measurement as well as atomic force microscopy. Tactile surface profiling is approved since
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::698ac751388a558013421abb94ab9c55
https://doi.org/10.1007/978-3-030-29454-0_2
https://doi.org/10.1007/978-3-030-29454-0_2
Autor:
Michael Quinten
Publikováno v:
A Practical Guide to Surface Metrology ISBN: 9783030294533
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f6aaa5f7e8ae34e17f31a6b2feaf493
https://doi.org/10.1007/978-3-030-29454-0_6
https://doi.org/10.1007/978-3-030-29454-0_6
Autor:
Michael Quinten
Publikováno v:
A Practical Guide to Surface Metrology ISBN: 9783030294533
Interactions among a surface and a probing unit are not restricted on mechanical forces. This became evident already from the extensions of the atomic force microscope in the previous chapter. Strong interactions can also occur for long-range electri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94f48a67e5f28c79924261067dbb7361
https://doi.org/10.1007/978-3-030-29454-0_3
https://doi.org/10.1007/978-3-030-29454-0_3
Autor:
Michael Quinten
Publikováno v:
A Practical Guide to Surface Metrology ISBN: 9783030294533
The nature of technical relevant surfaces is often as complex as measurement of their properties cannot be carried out with a metrology tool with one or two specialized sensors. Instead, the industry increasingly looks for flexible and future-safe me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75b2b9a5e8c4f0164cef1a783c5b1e88
https://doi.org/10.1007/978-3-030-29454-0_7
https://doi.org/10.1007/978-3-030-29454-0_7