Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Michael Pronath"'
Autor:
Michael Pronath
Publikováno v:
NEWCAS
Verification of custom circuit designs for parametric variation defects has become a must-have procedure for today's nanometer designs. Statistical analysis of circuits poses a challenge because the simulation effort is often high, and the accuracy o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1710d98b59eb01579f78b068ec3b720e
https://doi.org/10.1109/newcas44328.2019.8961260
https://doi.org/10.1109/newcas44328.2019.8961260
Autor:
Michael Pronath
Publikováno v:
SoCC
Designing circuits for enhanced IoT (“Internet of Things”) applications is one of the current growth driver for the electronics industry. Optimizing such circuits for lowest power consumption while maximize functionality and performance is key fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5bbf2b06e6f0ca73178a8ae6c05bc1c
https://doi.org/10.1109/socc.2017.8225982
https://doi.org/10.1109/socc.2017.8225982
Aging phenomena, on top of process variations along with temperature and supply voltage variations, translate into complex degradation effects on the required performance and yield of nanoscale circuits. The proposed paper focuses on the development
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a09797db9bf2edab52b9a05e65f294d
http://hdl.handle.net/11573/851860
http://hdl.handle.net/11573/851860
Publikováno v:
itit. 41:42-45
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79feb6fbd217028a80f5348cc5281054
https://doi.org/10.1524/itit.1999.41.2.42
https://doi.org/10.1524/itit.1999.41.2.42
Autor:
Michael Pronath, Antonio Colaci, Andrea Roggero, Andreas Ripp, Gianluigi Boarin, Gunter Strube, Lorenzo Civardi, Carlo Roma
Publikováno v:
SBCCI
In this paper we will demonstrate the benefits of systematic circuit analysis and optimization applied at different abstraction levels of a typical analog and mixed-signal design to address market requirements and technical challenges of nanometer te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9439c02d3bd3c6cb03d0a7d0e35af2a0
https://doi.org/10.1145/1854153.1854165
https://doi.org/10.1145/1854153.1854165
Publikováno v:
Modeling, Simulation, and Optimization of Integrated Circuits ISBN: 9783034894265
An overview of the problem of go/no-go testing for parametric faults in analog integrated circuits is given. In a linear model that includes both test stimulus and measurement errors, the influence of such errors on the test decision is analyzed in o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e3a2ed0d667fdb996b5c374c611aaa3
https://doi.org/10.1007/978-3-0348-8065-7_18
https://doi.org/10.1007/978-3-0348-8065-7_18
Publikováno v:
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169).
This paper presents a new method to identify mismatch-relevant transistor pairs at the circuit level. It consists in a two-stage selection process that is derived from a sensitivity-based formulation of matching relevancy and is thus very fast. The p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f08a163da88beb663a0cbc682d66767
https://doi.org/10.1109/cicc.2001.929802
https://doi.org/10.1109/cicc.2001.929802
Autor:
Michael Pronath, S. Zizala, R. Schwencker, Kurt Antreich, J. Eckmueller, Frank Schenkel, Helmut Graeb
Publikováno v:
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).
This paper presents a method to consider local process variations, which crucially influence the mismatch-sensitive analog components, within a new simulation-based analog synthesis tool called WiCkeD. WiCkeD includes tolerance analysis, performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ea2d5b386322a63cbea389f2ba85c0c
https://doi.org/10.1109/cicc.2000.852720
https://doi.org/10.1109/cicc.2000.852720
Autor:
Helmut Graeb, Michael Pronath, Stephen Zizala, Frank Schenkel, Kurt Antreich, Robert Schwencker
Publikováno v:
DAC
We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency of yield estimation and optimization are guaranteed by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0d3bf7baaec3e721e822e99102fd6be
https://doi.org/10.1145/378239.379079
https://doi.org/10.1145/378239.379079
Autor:
Ulf Schlichtmann, Manuel Schmidt, Harald Kinzelbach, Michael Pronath, Volker Glockel, Manfred Dietrich, Uwe Eichler, Joachim Haase
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05427f90193db3f25445281bf92e4363
http://www.scopus.com/inward/record.url?eid=2-s2.0-70350046953&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-70350046953&partnerID=MN8TOARS