Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Michael Patrick Clinton"'
Autor:
Hugh P. McAdams, Scott R. Summerfelt, Michael Patrick Clinton, John A. Rodriguez, Steven Bartling, Sudhanshu Khanna
Publikováno v:
IEEE Journal of Solid-State Circuits. 49:95-106
This paper presents a nonvolatile logic (NVL)-based 32-b microcontroller system-on-chip (SoC) that backs up its working state (all flip-flops) upon receiving a power interrupt, has zero leakage in sleep mode, and needs less than 400 ns to restore the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09acac9eaf909212cfcb97df2e052747
https://doi.org/10.1109/jssc.2013.2284367
https://doi.org/10.1109/jssc.2013.2284367
Publikováno v:
IEEE Journal of Solid-State Circuits. 47:141-150
In the effort to achieve low access energy non-volatile memory, challenges are encountered in sensing data at low power supply voltage. This work presents the design of a ferroelectric random access memory (FRAM) as a promising candidate for this nee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e082487aed5b88c690a28f6fd141f5fa
https://doi.org/10.1109/jssc.2011.2164732
https://doi.org/10.1109/jssc.2011.2164732
Autor:
Steven Bartling, John A. Rodriguez, Hugh P. McAdams, Michael Patrick Clinton, Scott R. Summerfelt, Sudhanshu Khanna
Publikováno v:
2013 IEEE Asian Solid-State Circuits Conference (A-SSCC).
Catalog ULP microcontrollers (MCUs) have to balance the needs of diverse customers by providing high performance along with near zero standby power and fast wakeup times for real time applications. We present a full HVT 8MHz 75uA/MHz Non-Volatile Log
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2c1f11edf4a3388ad8912cd0ade86db
https://doi.org/10.1109/asscc.2013.6690972
https://doi.org/10.1109/asscc.2013.6690972
Publikováno v:
ISSCC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66803b04905eb5d836ac7c72a2be419f
https://doi.org/10.1109/isscc.2013.6487848
https://doi.org/10.1109/isscc.2013.6487848
Autor:
Sudhanshu Khanna, Scott R. Summerfelt, Steven Bartling, Hugh P. McAdams, Michael Patrick Clinton, John A. Rodriguez
Publikováno v:
ISSCC
We demonstrate a non-volatile logic (NVL)-based SoC that backs up its working state (all flip-flops) upon receiving a power interrupt, has zero leakage in sleep mode, and needs less than 400ns to restore the system state upon power-up. Without NVL, a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0c68ad9b890a1f538298f2d8f530b97
https://doi.org/10.1109/isscc.2013.6487802
https://doi.org/10.1109/isscc.2013.6487802
Publikováno v:
ISSCC
In scaled VLSIs, a reliable robust circuit system is essential for the sustainable secure society. The threat to the VLSI system is caused by device, circuit or system issues. This forum provides an overview of the technical challenges as well as rec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d03be64efc8d77363c5de5a193ac975
https://doi.org/10.1109/isscc.2012.6177114
https://doi.org/10.1109/isscc.2012.6177114
Autor:
Michael Patrick Clinton, Leland Chang
Publikováno v:
ISSCC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d19635f1bef72fbd8b3797a1309eaa4
https://doi.org/10.1109/isscc.2012.6177132
https://doi.org/10.1109/isscc.2012.6177132
Publikováno v:
CICC
This paper will discuss the challenges that continued technology scaling present to circuit designers and how the close interaction between the development of technology, design automation (EDA) tools and the circuit designer can overcome these chall
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1bb8cbaeed5eccafedbf47da91ae801
https://doi.org/10.1109/cicc.2011.6055353
https://doi.org/10.1109/cicc.2011.6055353
Publikováno v:
ISSCC
Low-power portable electronics such as implantable medical devices require low-access-energy non-volatile memory to deliver longer battery lifetime and richer functionality. Ferroelectric random access memory (FeRAM) technology is a good candidate fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b813637ae51358525bf6c1fdae33d7f
https://doi.org/10.1109/isscc.2011.5746285
https://doi.org/10.1109/isscc.2011.5746285
Autor:
Rahul M. Rao, Michael Patrick Clinton
Publikováno v:
Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4f550e820f4800590e18b2f90d54273
https://doi.org/10.1145/3258233
https://doi.org/10.1145/3258233