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pro vyhledávání: '"Michael J. Prokosch"'
Publikováno v:
Plasma Processes and Polymers. 2:547-553
Atomic force microscopy (AFM), contact-angle measurements, and X-ray photoelectron spectroscopy (XPS or ESCA) were used to characterize biaxially oriented poly(propylene) (PP) films modified by exposure to a corona discharge. Surface analysis was per