Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Michael Hargrove"'
Autor:
Yutong Xie, Benyamin Davaji, Peter C. Doerschuk, Amit Lal, Ivan Chakarov, Sandy Wen, Michael Hargrove, David Fried
Publikováno v:
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Autor:
Campbell Millar, Salvatore Maria Amoroso, Michael Hargrove, Binjie Cheng, Ken Greiner, Asen Asenov, Louis Gerrer, Razaidi Hussin, David M. Fried, Craig Alexander, Dave Reid, Andrew R. Brown
Publikováno v:
IEEE Transactions on Electron Devices. 62:1739-1745
In this paper we illustrate how the predictive Technology Computer Aided Design (TCAD) process device simulation can be used to evaluate process, statistical, and time-dependent variability at the early stage of the development of new technology. Thi
Publikováno v:
2012 IEEE International Conference on Microelectronic Test Structures.
We present a simple test structure to measure C-V and I-V curves of the same nominal size FET. The structure is simple enough to be used for technology development, requires only first metal for routing, and allows parallel test. It is an extension o
Publikováno v:
The Journal of Financial and Quantitative Analysis. 12:377
A common dilemma faced by investors and portfolio managers is the tradeoff preference between risk and return. The general consensus and convention in finance and economics is that, in the aggregate, investors do not seek risk for its own sake. If so