Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Michael Fritze"'
Autor:
Michael Fritze
Publikováno v:
Novel Patterning Technologies 2021.
The end of Moore’s law scaling represents a major paradigm change for the semiconductor industry. Value-add will no longer defined simply by technology but by custom design and architecture solutions for specific applications. This represents a shi
Autor:
Albrecht Günther, Anke Werner, Michael Fritzenwanger, Martin Brauer, Martin Freesmeyer, P. Christian Schulze, Farid Salih, Robert Drescher
Publikováno v:
Neurological Research and Practice, Vol 6, Iss 1, Pp 1-4 (2024)
Externí odkaz:
https://doaj.org/article/4e3ad054205e4f66b9cba1cd3b6538b7
Autor:
Michael Bajura, Michael Fritze, Jyothi Velamala, Ketul B. Sutaria, Yu Cao, Ivan Sanchez Esqueda, J. R. Ahlbin, Mike Shuo-Wei Chen
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33:8-23
Integrated circuit design in the late CMOS era is challenged by the ever-increasing variability and reliability issues. The situation is further compounded by real-time uncertainties in workload and ambient conditions, which dynamically influence the
Autor:
Michael Fritze, Robert H. Reuss
Publikováno v:
Proceedings of the IEEE. 98:139-143
This special issue focuses on ultralow power (ULP) solutions in chips and emphasizes power management design primarily in commercial CMOS applications for mobile/portable communications and sensor systems.
Autor:
Ashok K. Sood, Isaac Lund, Yash R. Puri, Harry Efstathiadis, Pradeep Haldar, Nibir K. Dhar, Jay Lewis, Madan Dubey, Eugene Zakar, Priyalal Wijewarnasuriya, Dennis L. Polla, Michael Fritze
Publikováno v:
Graphene-New Trends and Developments
Graphene has amazing abilities due to its unique band structure characteristics de‐ fining its enhanced electrical capabilities for a material with the highest characteris‐ tic mobility known to exist at room temperature. The high mobility of gra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d67028c47a62113666f478d729a357cc
http://www.intechopen.com/articles/show/title/review-of-graphene-technology-and-its-applications-for-electronic-devices
http://www.intechopen.com/articles/show/title/review-of-graphene-technology-and-its-applications-for-electronic-devices
Autor:
C. Chen, Peter W. Wyatt, Craig L. Keast, David K. Astolfi, Chenson Chen, J.A. Burns, Michael Fritze, D.-R. Yost, Vyshnavi Suntharalingam, P. M. Gouker
Publikováno v:
IEEE Circuits and Devices Magazine. 19:43-47
We have developed resolution-enhanced optical lithography processes that have enabled us to fabricate devices with deep sub-100 nm feature sizes. Isolated gate features were resolved down to 40 nm in resist using optimized phase-shift lithography pro
Publikováno v:
SoCC
Increasing computing power efficiency has become more important as more applications are moving to mobile platforms, which tend to have a limited power available. Being able to perform a wide variety of computations efficiently is especially importan
Publikováno v:
HOST
Split-fabrication has been proposed as an approach for secure and trusted access to advanced microelectronics manufacturing capability using un-trusted sources. Each wafer to be manufactured is processed by two semiconductor foundries, combining the
Autor:
Konrad Kirsch, Stefan Heymel, Albrecht Günther, Kathleen Vahl, Thorsten Schmidt, Dominik Michalski, Michael Fritzenwanger, Paul Christian Schulze, Rüdiger Pfeifer
Publikováno v:
BMC Neurology, Vol 21, Iss 1, Pp 1-8 (2021)
Abstract Background This study aimed to assess the prognostic value regarding neurologic outcome of CT neuroimaging based Gray-White-Matter-Ratio measurement in patients after resuscitation from cardiac arrest. Methods We retrospectively evaluated CT
Externí odkaz:
https://doaj.org/article/5a62108f14ab4b13af3cf9ba4136e710
Autor:
Michael Fritze
Publikováno v:
2013 IEEE International Integrated Reliability Workshop Final Report.
I will present an overview of the work my organization is doing in support of the DARPA “IRIS” Program. Our work: focuses on developing the technology to predict the long-term reliability of COTS Ics (both Digital and Analog Mixed Signal) from a