Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Michael B. Kaplinsky"'
Autor:
Constantine N. Manikopoulos, E.S.F. Hou, Nathaniel J. McCaffrey, Jun Li, Walter F. Kosonocky, Michael B. Kaplinsky, Nuggehalli M. Ravindra
Publikováno v:
Proceedings of the IEEE International Symposium on Industrial Electronics.
Multi-wavelength imaging pyrometer (M-WIP) is presented for remote sensing of temperature profiles of targets with unknown emissivity. A software package was developed for calibration and real-time M-WIP measurements. An experimental 7-filter line-se
Publikováno v:
SPIE Proceedings.
Experimental Multi-wavelength Imaging Pyrometer (M-WIP) is presented for remote sensing of temperature profiles of targets with unknown spectrally varying emissivity. A software package was developed for calibration and real-time M-WIP measurements.
Autor:
Walter F. Kosonocky, Michael B. Kaplinsky, Nathaniel J. McCaffrey, Edwin S. H. Hou, Constantine N. Manikopoulos, Nuggehalli M. Ravindra, S. Belikov, Jun Li, Vipulkumar Patel
Publikováno v:
SPIE Proceedings.
An apparatus and method for non-contact real-time measurements of temperature and emissivity profiles of radiant targets with unknown spectral emissivity. The selected points or regions on the radiant target are imaged onto an array of photodetectors
Autor:
Walter F. Kosonocky, Jun Li, Nuggehalli M. Ravindra, Michael B. Kaplinsky, Vipulkumar Patel, Constantine N. Manikopoulos, Edwin Hou, Nathaniel J. McCaffrey
Publikováno v:
Optical Engineering. 36:3176
A multiwavelength imaging pyrometer (MWIP) is described that permits real-time remote sensing of temperature profiles of targets with unknown emissivity by measuring the spectral radiance of a target at several distinct wavelengths using a 3203122-el
Conference
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Conference
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Autor:
Kaplinsky, Michael B., Jun Li, McCaffrey, Nathanial J., Patel, Vipulkumar, Hou, Edwin S. H., Ravindra, Nuggehalli M., Manikopoulos, Constantine N., Kosonocky, Walter F.
Publikováno v:
Optical Engineering; Nov1997, Vol. 36 Issue 11, p3176-3187, 12p
Autor:
Kaplinsky, M.B., Kosonocky, W.F., McCaffrey, N.J., Jun Li, Hou, E.S.F., Manikopoulos, C.N., Ravindra, N.M.
Publikováno v:
1995 Proceedings of the IEEE International Symposium on Industrial Electronics; 1990, Issue 1, p199-199, 1p