Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Michael Ameen"'
Autor:
Kramer, Michael Ameen
Gemeinsame Schulfeiern mit religiösen Bezügen sind wichtige gesellschaftliche Ereignisse für den Zusammenhalt über religiöse und kulturelle Identifikationen und Identitäten hinaus. Dafür wurde – hauptsächlich von christlichen AutorInnen –
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f648a05e51640254927815710e30b84
Publikováno v:
Handbook of Semiconductor Manufacturing Technology ISBN: 9781315213934
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68c46463ebe3c724d655d7afc91519fd
https://doi.org/10.1201/9781420017663-7
https://doi.org/10.1201/9781420017663-7
Autor:
Michael Ameen, Motofumi Suzuki, W. Sakai, Aditya Agarwal, Kaoru Nakajima, Kenji Kimura, Hiroshi Harima, H.-J.L. Gossmann, T. Matsushita
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 249:432-435
The strain in a Si(18 nm)/Si 0.79 Ge 0.21 heterostructure is studied by means of high-resolution RBS/channeling angular scan. The observed channeling dip for the strained-Si layer is found to be shifted from that for the substrate Si 0.79 Ge 0.21 . T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94ac7c4d0831d69d0ecc1dd275d4b742
https://doi.org/10.1016/j.nimb.2006.03.024
https://doi.org/10.1016/j.nimb.2006.03.024
Publikováno v:
IEEE Electron Device Letters. 26:234-236
Pulsed excimer laser annealing (ELA) is used to reduce the poly-Si gate depletion effect (to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::171ed6ecffcfe935ce6e4787620fd6d5
https://doi.org/10.1109/led.2005.845502
https://doi.org/10.1109/led.2005.845502
Autor:
Michael Ameen, Bill Chang
Semiconductor device manufacturing is facing stringent challenges in advanced COMS process technology nodes. Ion implantation technology has always been a good solution of last resort since it’s got a much wider latitude and stronger flexibility to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b2eeb9b753dfb91e789562f6083674df
https://doi.org/10.5772/24194
https://doi.org/10.5772/24194
Publikováno v:
Handbook of Semiconductor Manufacturing Technology, Second Edition ISBN: 9781574446753
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8ab07b32350bf64c451171aada5615b
https://doi.org/10.1201/9781420017663.ch7
https://doi.org/10.1201/9781420017663.ch7
Publikováno v:
ECS Meeting Abstracts. :628-628
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::558199849f2e60611ff955f08e0579a0
https://doi.org/10.1149/ma2005-01/14/628
https://doi.org/10.1149/ma2005-01/14/628