Zobrazeno 1 - 10
of 69
pro vyhledávání: '"Michael A. Russak"'
Autor:
Xizeng Shi, Kroum S. Stoev, Francis H. Liu, Prakash Prabhu, Z.W. Dong, Shin Funada, Brij B. Lal, M. Gibbons, Michael A. Russak, C. Chien, M. Schultz, J. Kimmal, H.C. Tong, D. Wachenschwnz, A. Talalai, H. Nguyen, L. Mei, S.S. Malhotra, Yingjian Chen, A. Varlahanov
Publikováno v:
IEEE Transactions on Magnetics. 37:1264-1267
We have successfully demonstrated longitudinal recording at areal densities greater than 60 Gb/in/sup 2/ at data rates as high as 160 Mbps (20 MB/s) and at a Bit-Aspect-Ratio (BAR) of 5.7, using merged inductive-write/spin-valve-read heads with micro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c9b5e3139c7b93aa58b7b7a9dee8560
https://doi.org/10.1109/20.950813
https://doi.org/10.1109/20.950813
Autor:
S. Dey, S.S. Malhotra, Brij B. Lal, Francis H. Liu, Michael A. Russak, M. Schultz, Hua-Ching Tong, J. Kimmal, Kroum S. Stoev, S. Shi
Publikováno v:
IEEE Transactions on Magnetics. 36:2143-2147
A 26.5 Gb/in/sup 2/ areal-density demonstration was made using low-noise, thermally stable media and advanced dual-spin-valve heads. The demonstration was achieved at a linear density of 504 kbpi, a track density of 52.6 ktpi, and a data transfer rat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::928f20b6dbcc479067fcfb1029e13877
https://doi.org/10.1109/20.908335
https://doi.org/10.1109/20.908335
Publikováno v:
Journal of The Electrochemical Society. 140:2192-2197
The pitting behavior of sputter-deposited Al binary alloy thin films was studied. Pitting and repassivation potentials were determined in 0.1M NaCl for samples in freshly deposited and air-aged states. Aging for several years in laboratory air increa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6d717df91e20f2a26919db47f27ded87
https://doi.org/10.1149/1.2220794
https://doi.org/10.1149/1.2220794
Autor:
H. S. Isaacs, Gerald S. Frankel, Michael A. Russak, A. G. Schrott, A. J. Davenport, Christopher V. Jahnes
Publikováno v:
ChemInform. 23
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::371e1a5dac02d6837e77aee37bd38f34
https://doi.org/10.1002/chin.199243027
https://doi.org/10.1002/chin.199243027
Publikováno v:
IEEE Transactions on Magnetics. 28:1904-1910
Ni/sub 80/Fe/sub 20/ thin films were deposited using a wide range of process parameters in a dual source ion beam sputter deposition system. The films were characterized structurally, chemically, and magnetically. Two modes of deposition were investi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db60487543584737851ab030649eec01
https://doi.org/10.1109/20.144746
https://doi.org/10.1109/20.144746
Autor:
A. J. Davenport, Michael A. Russak, A. G. Schrott, Gerald S. Frankel, Hugh S. Isaacs, Christopher V. Jahnes
Publikováno v:
Journal of The Electrochemical Society. 139:1812-1820
Research was carried out in part at the National Synchroton Light Source, Brookhaven National Laboratory, which is supported by the U.S. Department of Energy, Division of Materials Sciences and Division of Chemical Sciences. A. J. D. and H. S. I. wer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c827fa095edc4eada4f6b707d7047874
https://doi.org/10.1149/1.2069503
https://doi.org/10.1149/1.2069503
Publikováno v:
Journal of Magnetism and Magnetic Materials. :1847-1850
Ni 80 Fe 20 thin films were deposited using a wide range of process parameters in a dual source ion-beam sputter deposition system. The films were characterized magnetically, structurally and chemically. Depending on specific deposition conditions, f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24680fa978315f66b3e366bfa1a9d6d3
https://doi.org/10.1016/0304-8853(92)91575-e
https://doi.org/10.1016/0304-8853(92)91575-e
Publikováno v:
Journal of Applied Physics. 87:5687-5689
Magnetic layer grain size plays an important role in determining the materials properties of longitudinal magnetic thin film media. Therefore, accurate and appropriate microstructural analysis is crucial to understanding the effects of changes in spu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1cd177d21ba9e3dbf4ecf28671d00761
https://doi.org/10.1063/1.372490
https://doi.org/10.1063/1.372490
Publikováno v:
IEEE Transactions on Magnetics. 36:2309-2311
The effects of CrRu underlayers on the grain size, lattice matching, magnetic, recording and thermal stability characteristics for CoCrPtTa thin film media are presented, CrRu/sub 10/ and CrRu/sub 20/ underlayers produced about 800-960 Oe higher coer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b748f039ed334601eef70f1db92c17d
https://doi.org/10.1109/20.908411
https://doi.org/10.1109/20.908411
Publikováno v:
IEEE Transactions on Magnetics. 36:2462-2464
An experimental technique has been developed to characterize the thermal stability of recording media. We measured the remanent magnetization decay in a significant range under various reverse fields in a short time scale. By directly fitting the exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::845f3ba4034992c8fbde7af786c04ce9
https://doi.org/10.1109/20.908466
https://doi.org/10.1109/20.908466