Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Michael, Labella"'
Autor:
Aaron Bostwick, Chris Jozwiak, Ursula Wurstbauer, Michael LaBella, Joshua A. Robinson, Shruti Subramanian, Eli Rotenberg, Jonas Kiemle, Deeksha Sharma, Alexander W. Holleitner, Hala Al-Sadeg, Florian Sigger, Paul Seifert, Quinn Campbell, Philipp Zimmermann, Randall M. Feenstra, Ismaila Dabo, Dacen Waters, Simon Moser, Thomas E. Beechem, Roland J. Koch
Publikováno v:
ACS Nano. 14:16663-16671
Integration of semiconducting transition metal dichalcogenides (TMDs) into functional optoelectronic circuitries requires an understanding of the charge transfer across the interface between the TMD and the contacting material. Here, we use spatially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbe78589da9d2ea0594d6eb67885ffef
https://doi.org/10.1021/acsnano.0c02527
https://doi.org/10.1021/acsnano.0c02527
Autor:
Shruti, Subramanian, Quinn T, Campbell, Simon K, Moser, Jonas, Kiemle, Philipp, Zimmermann, Paul, Seifert, Florian, Sigger, Deeksha, Sharma, Hala, Al-Sadeg, Michael, Labella, Dacen, Waters, Randall M, Feenstra, Roland J, Koch, Chris, Jozwiak, Aaron, Bostwick, Eli, Rotenberg, Ismaila, Dabo, Alexander W, Holleitner, Thomas E, Beechem, Ursula, Wurstbauer, Joshua A, Robinson
Publikováno v:
ACS nano. 14(12)
Integration of semiconducting transition metal dichalcogenides (TMDs) into functional optoelectronic circuitries requires an understanding of the charge transfer across the interface between the TMD and the contacting material. Here, we use spatially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::419ab98efd287ac1621a21df4da8cb21
https://pubmed.ncbi.nlm.nih.gov/33196167
https://pubmed.ncbi.nlm.nih.gov/33196167
Autor:
Edward S. Barnard, Michael LaBella, Amanul Haque, Teague Williams, P. James Schuck, Baoming Wang, Kehao Zhang, Ganesh R. Bhimanapati, Nicholas J. Borys, Joshua A. Robinson, Ke Xu, Ke Wang, Brian M. Bersch, Susan K. Fullerton-Shirey
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-8 (2017)
Scientific reports, vol 7, iss 1
Scientific reports, vol 7, iss 1
Evaluating and tuning the properties of two-dimensional (2D) materials is a major focus of advancing 2D science and technology. While many claim that the photonic properties of a 2D layer provide evidence that the material is “high quality”, this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::73b9b75a806940939a60f90ddcbbde08
http://link.springer.com/article/10.1038/s41598-017-16970-6
http://link.springer.com/article/10.1038/s41598-017-16970-6
Autor:
Kehao, Zhang, Nicholas J, Borys, Brian M, Bersch, Ganesh R, Bhimanapati, Ke, Xu, Baoming, Wang, Ke, Wang, Michael, Labella, Teague A, Williams, Md Amanul, Haque, Edward S, Barnard, Susan, Fullerton-Shirey, P James, Schuck, Joshua A, Robinson
Publikováno v:
Scientific Reports
Evaluating and tuning the properties of two-dimensional (2D) materials is a major focus of advancing 2D science and technology. While many claim that the photonic properties of a 2D layer provide evidence that the material is “high quality”, this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::1598e969280d7146c2558fcf489b1463
https://pubmed.ncbi.nlm.nih.gov/29209000
https://pubmed.ncbi.nlm.nih.gov/29209000
Autor:
Michael S. Bresnehan, Suman Datta, David W. Snyder, Kathleen A. Trumbull, Randal Cavalero, Matthew J. Hollander, Ashish Agrawal, Joshua A. Robinson, Michael LaBella
Publikováno v:
physica status solidi (a). 210:1062-1070
We present a comprehensive study on the integration of hexagonal boron nitride (h-BN) with epitaxial graphene (EG) and bilayer hydrogen intercalated EG. Charged impurity scattering is the dominant scattering mechanism for as-grown and h-BN coated gra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a24ff0ad9f7383932ba053ac0088dfe5
https://doi.org/10.1002/pssa.201228683
https://doi.org/10.1002/pssa.201228683
Autor:
Thomas P. Medill, Zachary Hughes, Matthew J. Hollander, Michael LaBella, Xiaojun Weng, Douglas E. Wolfe, Daniel A. Grave, Anna L. Stump, Joshua A. Robinson
Publikováno v:
Surface and Coatings Technology. 206:3094-3103
Thick polycrystalline gadolinium oxide (Gd 2 O 3 ) films up to 11 μm in thickness were deposited via reactive electron beam-physical vapor deposition (EB-PVD) on silicon (111) substrates for use in neutron radiation detection. The effects of coating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b41c05b1a328a3d35c7fa81d21f942d
https://doi.org/10.1016/j.surfcoat.2011.12.031
https://doi.org/10.1016/j.surfcoat.2011.12.031
Autor:
Richard Kasarda, David W. Snyder, Kathleen A. Trumbull, Matthew J. Hollander, B.E. Weiland, Michael LaBella, Ying Liu, Casey A. Howsare, Conor Puls, Mark A. Fanton, Joshua A. Robinson, J.P. Stitt
Publikováno v:
ACS Nano. 5:8062-8069
We present a novel method for the direct metal-free growth of graphene on sapphire that yields high quality films comparable to that of graphene grown on SiC by sublimation. Graphene is synthesized on sapphire via the simple decomposition of methane
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::65975de94cb42516edcaec6ce93929cc
https://doi.org/10.1021/nn202643t
https://doi.org/10.1021/nn202643t
Autor:
Casey T. DeRoo, Michael LaBella, Tyler Steiner, Chad Eichfeld, W. Drawl, Jake A. McCoy, Bangzhi Liu, Drew M. Miles, Randall L. McEntaffer, Guy P. Lavallee
Publikováno v:
The Astrophysical Journal. 869:95
We present the methodology used to fabricate an X-ray reflection grating and describe a technique for grating replication. Further, we present the experimental procedure and results of a study to measure the diffraction efficiency of a replicated X-r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48421ff29ea82d4c11db8caac7ef294e
https://doi.org/10.3847/1538-4357/aaec73
https://doi.org/10.3847/1538-4357/aaec73
Autor:
Meredith Metzler, Nikola Belic, Gerald G Lopez, Kevin Lister, Michael LaBella, Ulrich Hofmann, Mohsen Azadi, Chad Eichfeld, Glen de Villafranca
Publikováno v:
Journal of Vacuum Science & Technology B. 36:06JA05
This work examines the isofocality of four commercially available positive resists for electron beam lithography (EBL) at 100 keV: AR-P 6200 (commercially known as CSAR 62) by AllResist GmbH, ZEP520A by Zeon Corp., polymethylmethacrylate 950 A4 (950k
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4563dedea64f0f05f1300505d6d59871
https://doi.org/10.1116/1.5048206
https://doi.org/10.1116/1.5048206
Autor:
Michael LaBella, K. Henry, Rahul Pandey, Nidhi Agrawal, Ke Wang, J. Maier, C. Eichfeld, Suman Datta, Markus Kuhn, Varistha Chobpattana, Souvik Mahapatra, Huichu Liu, Susanne Stemmer
Publikováno v:
2015 IEEE International Electron Devices Meeting (IEDM).
We present reliability analysis of the two most critical interfaces in III-V Heterojunction Tunnel FET (HTFET) design: (1) Tunnel Heterojunction is characterized in three-dimensional atomic scale resolution using Atom Probe Tomography. We explore the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b45d4553de56b90ee10f473e804a7637
https://doi.org/10.1109/iedm.2015.7409694
https://doi.org/10.1109/iedm.2015.7409694