Zobrazeno 1 - 10
of 75
pro vyhledávání: '"Michał Tadeusiewicz"'
Publikováno v:
International Journal of Electronics and Telecommunications, Vol vol. 67, Iss No 3, Pp 531-536 (2021)
This paper is focused on multiple soft fault diagnosis of linear time-invariant analog circuits and brings a method that achieves all objectives of the fault diagnosis: detection, location, and identification. The method is based on a diagnostic test
Externí odkaz:
https://doaj.org/article/0480d4a899d748feb94ce6b7852bd26e
Autor:
Michał Tadeusiewicz, Marek Ossowski
Publikováno v:
International Journal of Electronics and Telecommunications, Vol vol. 64, Iss No 1 (2018)
Externí odkaz:
https://doaj.org/article/8e0b546f5483466387db114ed30d1cd1
Autor:
Michał Tadeusiewicz, Stanisław Hałgas
Publikováno v:
Circuits, Systems, and Signal Processing.
This paper presents an efficient numerical method to solve systems of nonlinear algebraic equations. The method uses a homotopy simplicial approach associated with an integer algorithm. The integer algorithm is discussed in detail and supplemented wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7314888b13bdda839c4bd69727435a3d
https://doi.org/10.1007/s00034-023-02376-5
https://doi.org/10.1007/s00034-023-02376-5
Autor:
Stanisław Hałgas, Michał Tadeusiewicz
Publikováno v:
IET Circuits, Devices & Systems. 14:1220-1227
This study deals with a single soft fault diagnosis of non-linear circuits having multiple DC solutions. The key problem of the diagnosis is arranging a measurement test. Creation of the test for the above-defined class of circuits is discussed in de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f8766201ab33f96537a9e22074076cc
https://doi.org/10.1049/iet-cds.2020.0197
https://doi.org/10.1049/iet-cds.2020.0197
Autor:
Stanisław Hałgas, Michał Tadeusiewicz
Publikováno v:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering. 38:1770-1781
Purpose The purpose of this paper is to develop a method for multiple soft fault diagnosis of nonlinear circuits including fault detection, identification of faulty elements and estimation of their values in real circumstances. Design/methodology/app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13ca7e23e3fcca67e34dfdb37701ce17
https://doi.org/10.1108/compel-03-2019-0101
https://doi.org/10.1108/compel-03-2019-0101
Autor:
Michał Tadeusiewicz, Stanisław Hałgas
Publikováno v:
Measurement. 131:714-722
The problem of testing and diagnosing multiple soft faults in analog linear electronic circuits is discussed in this paper. An efficient method which detects faulty elements and evaluates their parameters is developed. The algorithm employs two diagn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::133798775aa814d0b8793e84aec1af26
https://doi.org/10.1016/j.measurement.2018.09.001
https://doi.org/10.1016/j.measurement.2018.09.001
Autor:
Michał Tadeusiewicz, Stanisław Hałgas
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 67:328-337
This paper is devoted to local parametric fault diagnosis of nonlinear analog integrated circuits designed in a bipolar and CMOS technology. An algorithm is proposed that allows estimating values of the considered set of the parameters. The algorithm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77dd378a5a9a2fd616ab82f76531e370
https://doi.org/10.1109/tim.2017.2775438
https://doi.org/10.1109/tim.2017.2775438
Autor:
Michał Tadeusiewicz, Stanisław Hałgas
Publikováno v:
Microelectronics Reliability. 72:90-97
This paper is devoted to fault diagnosis of nonlinear analog CMOS circuits designed in nanometer technology. A method that allows diagnosing a single soft short and local parameter variations, occurring simultaneously, is developed. The method exploi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0c752cf41e86042b82f1c4a43674fd0
https://doi.org/10.1016/j.microrel.2017.03.025
https://doi.org/10.1016/j.microrel.2017.03.025
Autor:
Stanisław Hałgas, Michał Tadeusiewicz
Publikováno v:
Journal of Electronic Testing. 33:147-156
The paper deals with multiple soft fault diagnosis of linear analog circuits. The basic problem of arranging diagnostic tests performed in DC or AC states is considered in detail. A systematic method is developed that allows finding values of the sou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5efb75f287492aad49b4121ba6f916fe
https://doi.org/10.1007/s10836-017-5650-4
https://doi.org/10.1007/s10836-017-5650-4
Autor:
Stanisław Hałgas, Michał Tadeusiewicz
Publikováno v:
Electronics
Volume 10
Issue 5
Electronics, Vol 10, Iss 550, p 550 (2021)
Volume 10
Issue 5
Electronics, Vol 10, Iss 550, p 550 (2021)
Parametric fault diagnosis of analog very high-frequency circuits consisting of a distributed parameter transmission line (DPTL) terminated at both ends by lumped one-ports is considered in this paper. The one-ports may include linear passive and act
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d1a6741e12203b39e34c00f30fa35671
https://doi.org/10.3390/electronics10050550
https://doi.org/10.3390/electronics10050550