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pro vyhledávání: '"Micahel Skoufis"'
Autor:
Dolores A. Black, Matthew J. Marinella, Jeffrey D. Black, Micahel Skoufis, Luis Bustamante, Heather Quinn, Hugh J. Barnaby, Matthew Breeding, Sapan Agarwal, Ben Feinberg, Michael Lee McLain, Lawrence T. Clark, John Brunhaver, Arun Rodrigues, Matthew Cannon
Publikováno v:
IEEE Transactions on Nuclear Science. 68:980-990
Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor’s scope makes physically correct modeling computationally intractable