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Meyer, W.E. (Walter Ernst)
Since the development of deep level transient spectroscopy (DLTS) in the 1970’s by Lang and others, the technique has become a powerful analytical tool to characterise the electrical properties of defects in semiconductors. With the development of
Externí odkaz:
http://hdl.handle.net/2263/25602
http://upetd.up.ac.za/thesis/available/etd-06182007-143820/
http://upetd.up.ac.za/thesis/available/etd-06182007-143820/
