Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Mevenkamp, Niklas"'
Autor:
Mevenkamp, Niklas, Berkels, Benjamin
Publikováno v:
2016 IEEE Winter Conference on Applications of Computer Vision (WACV)
We propose a novel method for multi-phase segmentation of images based on high-dimensional local feature vectors. While the method was developed for the segmentation of extremely noisy crystal images based on localized Fourier transforms, the resulti
Externí odkaz:
http://arxiv.org/abs/1902.09863
Autor:
Mevenkamp, Niklas a, MacArthur, Katherine E. b, Tileli, Vasiliki c, Ebert, Philipp d, Allen, Leslie J. b, e, Berkels, Benjamin a, Duchamp, Martial b, f, ⁎
Publikováno v:
In Ultramicroscopy February 2020 209
Autor:
Mevenkamp, Niklas
Publikováno v:
Aachen xxii, 201 Seiten (2017). doi:10.18154/RWTH-2017-04917 = Dissertation, RWTH Aachen University, 2017
RWTH Aachen University, Diss., 2017; 201 pp. (2017). = RWTH Aachen University, Diss., 2017
Modern scanning transmission electron microscopes (STEM) provide atomic resolution images of inorganic materials. Atom positions and other information ext
Modern scanning transmission electron microscopes (STEM) provide atomic resolution images of inorganic materials. Atom positions and other information ext
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06dc42cb5245b0a8d2b794e8f3c0f668
https://publications.rwth-aachen.de/record/690222
https://publications.rwth-aachen.de/record/690222
Publikováno v:
Goslar : Eurographics Asso. 63-70 (2014). doi:10.2312/vmv.20141277
VMV 2014 : Vision, Modeling and Visualization ; Darmstadt, Germany, October 08-10, 2014 / proceedings ed.: Dieter Fellner
VMV 2014 : Vision, Modeling and Visualization ; Darmstadt, Germany, October 08-10, 2014 / proceedings ed.: Dieter FellnerVMV 2014 : Vision, Modeling and Visualization, VMV 2014, Darmstadt, Germany, 2014-10-08-2014-10-10
VMV 2014 : Vision, Modeling and Visualization ; Darmstadt, Germany, October 08-10, 2014 / proceedings ed.: Dieter Fellner
VMV 2014 : Vision, Modeling and Visualization ; Darmstadt, Germany, October 08-10, 2014 / proceedings ed.: Dieter FellnerVMV 2014 : Vision, Modeling and Visualization, VMV 2014, Darmstadt, Germany, 2014-10-08-2014-10-10
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______791::af98c670e3a67b3073ee1532dd305582
Autor:
Mevenkamp, Niklas, Berkels, Benjamin
Publikováno v:
2016 IEEE Winter Conference on Applications of Computer Vision (WACV); 2016, p1-9, 9p
Autor:
Mevenkamp, Niklas, Berkels, Benjamin
Publikováno v:
Pattern Recognition 37th German Conference, GCPR 2015, Aachen, Germany, October 7-10, 2015, Proceedings; 2015, p105-116, 12p
Publikováno v:
Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p106-107, 2p, 2 Color Photographs