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pro vyhledávání: '"Metrology Naostructures"'
Autor:
Mrinalini, R Sri Muthu
With increase in the number of three dimensional (3-D) nanometer-scale objects that are being either fabricated or studied, there is a need to accurately characterize their geometry. While the Atomic force microscope (AFM) is a versatile tool for per
Externí odkaz:
http://etd.iisc.ernet.in/2005/3711
http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf
http://etd.iisc.ernet.in/abstracts/4581/G28317-Abs.pdf
