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Publikováno v:
IEEE Electron Device Letters. 35:998-1000
The noise performance of an InP BiCMOS process is presented. The process builds on IBM 90-nm RF CMOS and features heterogeneously integrated 250-nm InP DHBTs with f t /fmax values of ~300 GHz. Noise models have been extracted and the predicted perfor
Publikováno v:
2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
The broadband noise performance of silicon ger- manium (SiGe) and compound semiconductor (CS) heterojunc- tion bipolar transistors (HBTs) is presented. The key noise mechanisms in HBTs are summarized to provide a framework through which the noise lim