Výsledky vyhledávání - "Mercer, M.R."

Publikováno v: 2001 Proceedings International Symposium on Product Quality & Integrity Annual Reliability & Maintainability Symposium (Cat. No.01CH37179); 2001, p420-424, 5p

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Conference

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D.

Autor: Dworak, J., Grimaila, M.R., Sooryong Lee, Wang, L.-C., Mercer, M.R.

Publikováno v: Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159); 2000, p930-939, 10p

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Conference

On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.

Autor: Dworak, J., Grimaila, M.R., Cobb, B., Wang, T.-C., Wang, L.-C., Mercer, M.R.

Publikováno v: Proceedings of the Ninth Asian Test Symposium; 2000, p151-157, 7p

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60 Konferenční materiály
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2 circuit faults
2 circuit testing
2 electrical fault detection
2 fault detection
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1 benchmark testing
1 binary decision diagram
1 boolean difference
1 built-in self test
1 code coverage
1 combinational logic
1 contracts
1 data compression
1 defect level
1 delay testing
1 design verification
1 dfm
1 fabrication
1 false path
1 fault detectability
1 fault diagnosis
1 fault model
1 figure of merit
1 gene knockout mice
1 jb6 cells
1 lithography simulation
1 logic circuits
1 logic testing
1 ordered binary decision diagram
1 ordered binary decision diagrams
1 parasitic extraction
1 particulate matter
1 semiconductor device manufacture
1 silicosis
1 software testing
1 statistical timing analysis
1 symbolic simulation
1 symmetric functions
1 system sensitivity
1 system testing
1 test pattern generators
1 testability analysis
1 timing
1 timing analysis
1 total delay
1 use
1 yield

52 ieee
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6 ieee transactions on computers
3 ieee design & test of computers
3 ieee design and test of computers
3 ieee international test conference (tc)
2 25th acm/ieee, design automation conferenceproceedings 1988
2 ieee transactions on computer-aided design of integrated circuits & systems
2 ieee transactions on computer-aided design of integrated circuits and systems
2 ieee transactions on very large scale integration (vlsi) systems
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2 proceedings - design automation conference
2 proceedings - ieee international symposium on defect and fault tolerance in vlsi systems
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2 proceedings 2002 design, automation & test in europe conference & exhibition
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2 proceedings international conference on computer design vlsi in computers & processors (9780818675546)
2 proceedings international test conference 1996 test & design validity
2 proceedings of the 1995 european conference on design and test, edtc 1995
2 proceedings of the asian test symposium
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1 1991, proceedings international test conference
1 1992 proceedings 29th acm/ieee design automation conference
1 2001 proceedings international symposium on product quality & integrity annual reliability & maintainability symposium (cat. no.01ch37179)
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1 digest of papers eleventh annual 1993 ieee vlsi test symposium
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