Zobrazeno 1 - 10
of 433
pro vyhledávání: '"Menyhard, M."'
Publikováno v:
In Applied Surface Science 15 December 2022 605
Publikováno v:
In Surface & Coatings Technology 25 March 2020 386
Autor:
Süle, P., Menyhárd, M.
Probing the anomalous nanoscale intermixing using molecular dynamics (MD) simulations in Pt/Ti bilayer we characterize the superdiffusive nature of interfacial atomic transport. In particular, the low-energy ($0.5$ keV) ion-sputtering induced transie
Externí odkaz:
http://arxiv.org/abs/1403.0237
Autor:
Racz, A.S., Zambo, D., Dobrik, G., Lukacs, I., Zolnai, Z., Nemeth, A., Panjan, P., Deak, A., Battistig, G., Menyhard, M.
Publikováno v:
In Surface & Coatings Technology 25 August 2019 372:427-433
Autor:
Süle, P., Menyhárd, M.
Probing the anomalous nanoscale intermixing using molecular dynamics (MD) simulations in Pt/Ti bilayer we reveal the superdiffusive nature of interfacial atomic transport. It is shown that the Pt atoms undergo anomalous atomic transport across the an
Externí odkaz:
http://arxiv.org/abs/0802.2220
The ion-sputtering induced intermixing is studied by Monte-Carlo TRIM, molecular dynamics (MD) simulations, and Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate (Pt/Ti) and Ta/Ti/Pt/Si substrate (Ti/Pt) multilayers.
Externí odkaz:
http://arxiv.org/abs/cond-mat/0610227
Autor:
Süle, P., Menyhárd, M.
The ion-sputtering induced transient enhanced intermixing has been studied by molecular dynamics (MD) simulations in Pt/Ti and its anomalous nature has been explained as a superdiffusive transient enhanced interdiffusion. We find ballistic mixing and
Externí odkaz:
http://arxiv.org/abs/cond-mat/0605566
Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling
Autor:
Süle, P., Menyhard, M.
The ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multilayer. It has been shown that from AESD we can derive the low-energy mi
Externí odkaz:
http://arxiv.org/abs/cond-mat/0605130
Autor:
Menyhárd, M., Süle, P.
The ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multilayer. It has been shown that from AESD we can derive the low-energy mi
Externí odkaz:
http://arxiv.org/abs/cond-mat/0512053
The ion-sputtering induced intermixing is studied by molecular dynamics (MD) simulations and by Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate (Pt/Ti) and Ta/Ti/Pt/Si substrate (Ti/Pt) multilayers. Experimental ev
Externí odkaz:
http://arxiv.org/abs/cond-mat/0510077