Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Mengle Zhao"'
Autor:
Xingwang Li, Mengle Zhao, Xiang-Chuan Gao, Lihua Li, Dinh-Thuan Do, Khaled M. Rabie, Rupak Kharel
Publikováno v:
IEEE Access, Vol 8, Pp 51189-51199 (2020)
In this paper, we investigate the reliability and security of cooperative dual-hop non-orthogonal multiple access (NOMA) for internet-of-thing (IoT) networks, in which the transceivers consider a detrimental factor of in-phase and quadrature-phase im
Externí odkaz:
https://doaj.org/article/696a956eb6e9445a913a55b50921d84f
Autor:
Zhiguo Ding, Octavia A. Dobre, Mengle Zhao, Ming Zeng, Varun G. Menon, Shahid Mumtaz, Xingwang Li
Non-orthogonal multiple access (NOMA) and ambient backscatter communication have been envisioned as two promising technologies for the Internet-of-things due to their high spectral efficiency and energy efficiency. Motivated by this fact, we consider
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52c6664bc3ec7d684b91822cd867bbfb
http://arxiv.org/abs/2008.05798
http://arxiv.org/abs/2008.05798
In this correspondence, we investigate the reliability and the security of the ambient backscatter (AmBC) non-orthogonal multiple access (NOMA) systems, where the source aims to communicate with two NOMA users in the presence of an eavesdropper. To b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7be5e89517cc85ac3b8035d09153d9af
Autor:
Xingwang Li, Changsen Zhang, Rupak Kharel, Wali Ullah Khan, Khaled M. Rabie, Mengle Zhao, Jun Wu
Publikováno v:
Electronics, Vol 8, Iss 11, p 1327 (2019)
Electronics
Volume 8
Issue 11
Electronics
Volume 8
Issue 11
This paper investigates the reliability and security performance of the downlink non-orthogonal multiple access (NOMA) networks over Nakagami-m fading channels, where the base station (BS) aims to communicate with multi-antenna NOMA users in the pres
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0273dcb4c9b8230a122c3666b7e342f9
https://doi.org/10.3390/electronics8111327
https://doi.org/10.3390/electronics8111327