Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Meng-Hsu Wu"'
Autor:
Calvin Yi-Ping Chao, Meng-Hsu Wu, Shang-Fu Yeh, Chin-Hao Chang, Chi-Lin Lee, Chin Yin, Kuo-Yu Chou, Honyih Tu
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 9, Pp 972-984 (2021)
It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ch
Externí odkaz:
https://doaj.org/article/16be69d937ef4c6a980e1bb88730f4e9
Autor:
Meng-Hsu Wu, 吳孟旭
96
GPS measurement is a fast-developing ways in recent years because its simple and convenient, fast, the precision can reach such characteristics as each, etc. We already adopt it in an all-round reconstruction. Its has already progressed to me
GPS measurement is a fast-developing ways in recent years because its simple and convenient, fast, the precision can reach such characteristics as each, etc. We already adopt it in an all-round reconstruction. Its has already progressed to me
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/08733215411588010046
Autor:
Chi-Lin Lee, Calvin Yi-Ping Chao, Kuo-Yu Chou, Shang-Fu Yeh, Honyih Tu, Chin-Hao Chang, Meng-Hsu Wu, Yin Chin
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 9, Pp 972-984 (2021)
It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03823ddb608856a4193050953f86e1fa
https://doi.org/10.1109/jeds.2021.3120739
https://doi.org/10.1109/jeds.2021.3120739
Autor:
Meng-Hsu Wu, Kuo-Yu Chou, Philippe Paillet, Vincent Goiffon, Yin Chin, Lee Chih-Lin, Honyih Tu, Calvin Yi-Ping Chao, Shang-Fu Yeh
Publikováno v:
Sensors (Basel, Switzerland)
Sensors
Volume 19
Issue 24
Sensors
Volume 19
Issue 24
In this paper we present a systematic approach to sort out different types of random telegraph noises (RTN) in CMOS image sensors (CIS) by examining their dependencies on the transfer gate off-voltage, the reset gate off-voltage, the photodiode integ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de9c917088f59513457c718e5ea37c1a
http://europepmc.org/articles/PMC6960882
http://europepmc.org/articles/PMC6960882