Zobrazeno 1 - 10
of 424
pro vyhledávání: '"Memory diagnosis"'
Publikováno v:
2022 IEEE European Test Symposium (ETS).
High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::91cb450061a006493c08f25a64921b6a
https://doi.org/10.1109/ets54262.2022.9810467
https://doi.org/10.1109/ets54262.2022.9810467
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::61ef9ae7322fb3433b8035fd1e11b639
https://hdl.handle.net/2117/372115
https://hdl.handle.net/2117/372115
Conference
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Akademický článek
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Publikováno v:
ETS
Memories have been considered as one of the major drivers of CMOS technology, due to their high density, high capacity, critical timing, sensitivity, etc. Memory diagnosis is therefore important for technology and product development. Memory failure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6be3bed64f0f2cbf00abb41b06d6980f
https://doi.org/10.1109/ets.2016.7519314
https://doi.org/10.1109/ets.2016.7519314
Conference
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Autor:
Wei, Sin Yu, 魏欣俞
104
Memories have been considered as one of the major drivers of CMOS technology, due to their high density, high capacity, critical timing, sensitivity, etc. Memory diagnosis is therefore important for technology and product development. Memory
Memories have been considered as one of the major drivers of CMOS technology, due to their high density, high capacity, critical timing, sensitivity, etc. Memory diagnosis is therefore important for technology and product development. Memory
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/12722879034890103462
Autor:
Venkatesan Muthumalai, Rao Desineni, Nancy Bell, Ritesh Turakhia, Thomas Berndt, Aaron Sinnott, David Iverson
Publikováno v:
25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
Fast yield ramp is very important for a foundry during advanced process development and volume production. Logic and SRAM circuits are the major design blocks in advanced Integrated Circuits. Identification of systematic failures in logic and SRAM bl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a203b00c84db5bda437ceb26e9e77349
https://doi.org/10.1109/asmc.2014.6846945
https://doi.org/10.1109/asmc.2014.6846945
Publikováno v:
VTS
As VLSI technology advances and memories occupy more and more area in a typical SOC, memory diagnosis has become an important issue. In this paper, we propose the Memory Failure Pattern Analyzer (MFPA), which is developed for different memories and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e8a9f2c0dc412d5b6499ea84099e4ba
https://doi.org/10.1109/vts.2012.6231059
https://doi.org/10.1109/vts.2012.6231059
Autor:
M. de Carvalho, T. Kerekes, M. Sonza Reorda, Paolo Bernardi, N. Campanelli, Mario Barone, V. Tancorre, M. Terzi, D. Appello
Publikováno v:
DDECS
This paper describes an optimized embedded memory diagnosis flow that exploits many levels of knowledge to produce accurate failure hypothesis. The proposed post-processing analysis flow is composed of many steps investigating failure shapes as well
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3e8fd37877b562763e28ca8bb23b3dd
https://doi.org/10.1109/ddecs.2011.5783109
https://doi.org/10.1109/ddecs.2011.5783109