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Akademický článek
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Publikováno v:
In Microelectronics Journal September 2016 55:26-39
Autor:
Melikyan, Vazgen Shavarsh1 vazgenm@synopsys.com, Galstyan, Vache Ashot1 vache@synopsys.com
Publikováno v:
Annual Journal of Electronics. 2015, Vol. 9, p178-181. 4p.
Autor:
V. Margaryan Hayk, Sh. Melikyan Vazgen, T. Kostanyan Harutyun, H. Musayelyan Ruben, T. Grigoryan Hayk, T. Grigoryan Mushegh, Kh. Mkhitaryan Artur, T. Kostanyan Hakob
Publikováno v:
EWDTS
In modern integrated circuits the technology scaling and supply voltages values decreasing caused degradation of noise immunity of VLSI ICs. Therefore, the rejection of the noises in the power rails become a huge challenge considering the fact of are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::531924b32a271102feef0a4384ee3059
https://doi.org/10.1109/ewdts.2019.8884372
https://doi.org/10.1109/ewdts.2019.8884372
Publikováno v:
EWDTS
The regression test selection mechanism is represented, which leads to a decrease in the overall testing time. Provided the detailed description of the software, which selects and classifies the tests, as well as the initial results of the work done
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c1c062991358e563b9bc9be5aa6af15
https://doi.org/10.1109/ewdts.2019.8884407
https://doi.org/10.1109/ewdts.2019.8884407
Publikováno v:
EWDTS
A new method has been developed to obtain precise spice models of transistors that can be used in any type of research and training projects. The transistor's input and output characteristics have been received that have been compared with the charac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80fb175a1f2fa96536e995fe685c5f6f
https://doi.org/10.1109/ewdts.2019.8884379
https://doi.org/10.1109/ewdts.2019.8884379
Autor:
H Petrosyan Oleg, V Vardanyan Hayk, Melikyan Vazgen Sh., M Avetisyan Zaven, A Ghukasyan Sevak, T Hakobyan Kimik, H. Musayelyan Ruben
Publikováno v:
2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO).
The estimation of reliability of schemes has a great role at verification stage of integrated circuits. Estimation of reliability includes test of scheme considering circuit aging. As a result of aging the threshold voltage of transistors changes, wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21e4c659e050b26674096508b8334d8d
https://doi.org/10.1109/elnano.2019.8783524
https://doi.org/10.1109/elnano.2019.8783524
Publikováno v:
2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO).
On-chip decoupling capacitors used for reducing power supply noise. In this paper, a design technique for sizing and placing on-chip decoupling cells based on circuits switching activity is proposed. Evaluation of this methods on Universal Serial Bus
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d127aebdd6c83725bf908a4e7a270f4e
https://doi.org/10.1109/elnano.2017.7939729
https://doi.org/10.1109/elnano.2017.7939729