Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Meinhold, Mitchell W."'
Autor:
Meinhold, Mitchell W., 1972
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.
Includes bibliographical references (leaves 117-118).
Double-gate MOSFETs represent a significant solution to transistor sca
Includes bibliographical references (leaves 117-118).
Double-gate MOSFETs represent a significant solution to transistor sca
Externí odkaz:
http://hdl.handle.net/1721.1/28271
Autor:
Meinhold, Mitchell W., 1972
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
Includes bibliographical references (leaves 55-56).
by Mitchell Meinhold.
M.S.
Includes bibliographical references (leaves 55-56).
by Mitchell Meinhold.
M.S.
Externí odkaz:
http://hdl.handle.net/1721.1/43303
Autor:
Christian Wells, Meinhold Mitchell W, Ernest S. Kim, Peter Lewis, Jeffery B. DeLisio, Caprice Gray, David Hagerstrom, Daniela A. Torres
Publikováno v:
Journal of Microelectronics and Electronic Packaging. 17:52-58
A tool has been developed that supports a novel microelectronic integration paradigm whereby interconnects between components are directly established by way of micro-coax wirebonds. A near term use-case of the tool is to facilitate rapid prototyping
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39e79f3f25d9e2b58ab2c05cf5a968d7
https://doi.org/10.4071/imaps.1115585
https://doi.org/10.4071/imaps.1115585
Autor:
Meinhold, Mitchell W.1 mitmitch@alum.mit.edu, Jong-Wan Jung, Mitchell W.2 jjwkss@mtl.mit.edu, Antoniadis, Dimitri A.2 daa@mtl.mit.edu
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. Feb2004, Vol. 17 Issue 1, p35-41. 7p.
Autor:
Moon, Euclid E., Everett, Patrick N., Meinhold, Mitchell W., Mondol, Mark K., Smith, Henry I.
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1999, Vol. 17 Issue 6, p2698-2702, 5p
Publikováno v:
Japanese Journal of Applied Physics; December 2000, Vol. 39 Issue: 12 p7040-7040, 1p