Zobrazeno 1 - 10
of 60
pro vyhledávání: '"Meekhof, D.M."'
Autor:
Monroe, C., Meekhof, D.M.
Publikováno v:
Science. 5/24/1996, Vol. 272 Issue 5265, p1130. 6p. 1 Color Photograph, 4 Diagrams, 1 Chart, 8 Graphs.
Publikováno v:
Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium & Exhibition (Cat. No.00CH37052); 2000, p714-717, 4p
Autor:
Jefferts, S.R., Meekhof, D.M., Hollberg, L.W., Lee, D., Drullinger, R.E., Walls, F.L., Nelson, C., Levi, F., Parker, T.E.
Publikováno v:
Proceedings of the 1998 IEEE International Frequency Control Symposium (Cat No98CH36165); 1998, p2-5, 4p
Publikováno v:
IEEE Transactions on Instrumentation & Measurement. Apr2001, Vol. 50 Issue 2, p507. 3p. 1 Chart, 2 Graphs.
Autor:
Wineland, D.J., Monroe, C., Itano, W.M., King, B.E., Leibfried, D., Meekhof, D.M., Myatt, C., Wood, C.
Publikováno v:
Fortschritte der Physik / Progress of Physics; Jun1998, Vol. 46 Issue 4/5, p363-390, 28p
Publikováno v:
Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium & Exhibition (Cat. No.00CH37052); 2000, p711-713, 3p
Autor:
Heavner, T.P., Holberg, L., Jefferts, S.R., Kitching, J., Klipstein, W.M., Meekhof, D.M., Robinson, H.G.
Publikováno v:
Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium & Exhibition (Cat. No.00CH37052); 2000, p656-658, 3p
Autor:
Heavner, T.P., Hollberg, L., Jefferts, S.R., Kitching, J., Klipstein, W.M., Meekhof, D.M., Robinson, H.G.
Publikováno v:
IEEE Transactions on Instrumentation & Measurement; Apr2001, Vol. 50 Issue 2, p500, 3p, 2 Diagrams, 2 Graphs
Autor:
Norman, E.B., Meekhof, D.M.
Publikováno v:
Norman, E.B.; & Meekhof, D.M.(1987). NEW LIMITS ON THE DOUBLE BETA DECAY HALF-LIVES OF 94Zr, 96Zr, ll6Cd, AND 124Sn. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2np9m5dp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______325::0815b7a1a7da19a545e2b978ead9bc7b
http://www.escholarship.org/uc/item/2np9m5dp
http://www.escholarship.org/uc/item/2np9m5dp
Publikováno v:
Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031); 2000, p311-312, 2p