Zobrazeno 1 - 10
of 391
pro vyhledávání: '"Medjdoub, F"'
Publikováno v:
In Microelectronics Reliability November 2023 150
Publikováno v:
In e-Prime - Advances in Electrical Engineering, Electronics and Energy September 2023 5
Autor:
Mehta, J., Abid, I., Bassaler, J., Pernot, J., Ferrandis, P., Nemoz, M., Cordier, Y., Rennesson, S., Tamariz, S., Semond, F., Medjdoub, F.
Publikováno v:
In e-Prime - Advances in Electrical Engineering, Electronics and Energy March 2023 3
Autor:
Chikoidze, E., Tchelidze, T., Sartel, C., Chi, Z., Kabouche, R., Madaci, I., Rubio, C., Mohamed, H., Sallet, V., Medjdoub, F., Perez-Tomas, A., Dumont, Y.
Publikováno v:
In Materials Today Physics December 2020 15
Autor:
Borga, M., Meneghini, M., Benazzi, D., Canato, E., Püsche, R., Derluyn, J., Abid, I., Medjdoub, F., Meneghesso, G., Zanoni, E.
Publikováno v:
In Microelectronics Reliability September 2019 100-101
Autor:
Rzin, M., Meneghini, M., Rampazzo, F., Zhan, V. Gao, De Santi, C., Kabouche, R., Zegaoui, M., Medjdoub, F., Meneghesso, G., Zanoni, E.
Publikováno v:
In Microelectronics Reliability September 2019 100-101
Autor:
De Santi, C., Meneghini, M., Caria, A., Dogmus, E., Zegaoui, M., Medjdoub, F., Zanoni, E., Meneghesso, G.
Publikováno v:
In Microelectronics Reliability September 2017 76-77:575-578
Autor:
Sahoo, A.K., Subramani, N.K., Nallatamby, J.C., Sylvain, L., Loyez, C., Quere, R., Medjdoub, F.
Publikováno v:
In Solid State Electronics January 2016 115 Part A:12-16
Autor:
Medjdoub, F., Zegaoui, M., Linge, A., Grimbert, B., Silvestri, R., Meneghini, M., Meneghesso, G., Zanoni, E.
Publikováno v:
In Solid State Electronics November 2015 113:49-53
Publikováno v:
Proceeding of IWN2022
International Workshop on Nitride Semiconductors, IWN 2022
International Workshop on Nitride Semiconductors, IWN 2022, Oct 2022, Berlin, Germany
International Workshop on Nitride Semiconductors, IWN 2022
International Workshop on Nitride Semiconductors, IWN 2022, Oct 2022, Berlin, Germany
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4254::17825985b30d2152f14ef0c21fc70b18
https://hal.science/hal-03829087
https://hal.science/hal-03829087