Zobrazeno 1 - 10
of 238
pro vyhledávání: '"Medjanik K"'
Autor:
Fedchenko, O., Diekmann, F. K., Russmann, P., Kallmayer, M., Odenbreit, L., Souliou, S. M., Frachet, M., Winkelmann, A., Merz, M., Chernov, S. V., Vasilyev, D., Kutnyakhov, D., Tkach, O., Lytvynenko, Y., Medjanik, K., Schlueter, C., Gloskovskii, A., Peixoto, T. R. F., Hoesch, M., Tacon, M. Le, Mokrousov, Y., Rossnage, K., Schönhense, G., Elmers, H. -J.
A comprehensive study of the electronic and structural phase transition from 1T` to Td in the bulk Weyl semimetal Mo1-xWxTe2 at different doping concentrations has been carried out using time-of-flight momentum microscopy (including circular and line
Externí odkaz:
http://arxiv.org/abs/2310.10593
Autor:
Tkach, O., Babenkov, S., Lytvynenko, Y., Fedchenko, O., Medjanik, K., Vasilyev, D., Elmers, H. -J., Schönhense, G.
Imaging energy filters in photoelectron microscopes and momentum microscopes employ spherical fields with deflection angles of 90{\deg}, 180{\deg} and even 2 x 180{\deg}. These instruments are optimized for high energy resolution, yet they come along
Externí odkaz:
http://arxiv.org/abs/2303.18100
Autor:
Schoenhense, G., Medjanik, K., Fedchenko, O., Zymakova, A., Chernov, S., Vasilyev, D., Babenkov, S., Elmers, H. J., Baumgärtel, P., Goslawski, P., Oehrwall, G., Ellguth, M., Oelsner, A.
The small time gap of synchrotron radiation in conventional multi-bunch mode (100-500MHz) is prohibitive for time-of-flight (ToF) based electron spectroscopy. Even the new generation of delay-line detectors with improved time resolution (<100ps) yiel
Externí odkaz:
http://arxiv.org/abs/2105.00317
Autor:
Medjanik, K., Fedchenko, O., Yastrubchak, O., Sadowski, J., Sawicki, M., Gluba, L., Vasilyev, D., Babenkov, S., Chernov, S., Winkelmann, A., Elmers, H. J., Schoenhense, G.
Recent advances in the brilliance of hard-X-ray beamlines and photoelectron momentum microscopy facilitate bulk valence-band mapping and core-level-resolved hard-X-ray photoelectron diffraction (hXPD) for structural analysis in the same setup. High-q
Externí odkaz:
http://arxiv.org/abs/2010.12359
Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx-ky images, typically exceeding a full Brillouin z
Externí odkaz:
http://arxiv.org/abs/2007.16095
Autor:
Tkach, O., Vo, T.-P., Fedchenko, O., Medjanik, K., Lytvynenko, Y., Babenkov, S., Vasilyev, D., Nguyen, Q.L., Peixoto, T.R.F., Gloskowskii, A., Schlueter, C., Chernov, S., Hoesch, M., Kutnyakhov, D., Scholz, M., Wenthaus, L., Wind, N., Marotzke, S., Winkelmann, A., Rossnagel, K., Minár, J., Elmers, H.-J., Schönhense, G.
Publikováno v:
In Ultramicroscopy August 2023 250
Autor:
Seidel, J., Buhl, P. M., Mousavion, S., Dupé, B., Walther, E. S., Medjanik, K., Vasilyev, D., Babenkov, S., Ellguth, M., Maniraj, M., Sinova, J., Schönhense, G., Elmers, H. -J., Aeschlimann, M., Stadtmüller, B.
Surface alloys are highly flexible materials for tailoring the spin-dependent properties of surfaces. Here, we study the spin-dependent band structure of a DyAg$_2$ surface alloy formed on an Ag(111) crystal. We find a significant exchange spin-split
Externí odkaz:
http://arxiv.org/abs/1906.03780
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Medjanik, K., Babenkov, S. V., Chernov, S., Vasilyev, D., Elmers, H. J., Schoenhense, B., Schlueter, C., Gloskowskii, A., Matveyev, Yu., Drube, W., Schoenhense, G.
We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope can detect electrons with init
Externí odkaz:
http://arxiv.org/abs/1810.11366
Autor:
Schoenhense, G., Medjanik, K., Babenkov, S., Vasilyev, D., Ellguth, M., Fedchenko, O., Chernov, S., Schoenhense, B., Elmers, H. -J.
Owing to strongly enhanced bulk sensitivity, angle- or momentum-resolved photoemission using X-rays is an emergent powerful tool for electronic structure mapping. A novel full-field k-imaging method with time-of-flight energy detection allowed rapid
Externí odkaz:
http://arxiv.org/abs/1806.05871