Zobrazeno 1 - 10
of 355
pro vyhledávání: '"Meaudre, R."'
Deep defects and their electron-capture cross sections in polymorphous silicon-germanium thin films.
Publikováno v:
Journal of Applied Physics; 8/1/2005, Vol. 98 Issue 3, p033531, 7p, 1 Color Photograph, 2 Charts, 4 Graphs
Autor:
Meaudre *, R. (AUTHOR), Meaudre, M. (AUTHOR)
Publikováno v:
Philosophical Magazine Letters. Apr2005, Vol. 85 Issue 4, p185-192. 8p.
Autor:
Meaudre, R., Meaudre, M.
Publikováno v:
Philosophical Magazine Letters. May2002, Vol. 82 Issue 5, p303-312. 10p.
Publikováno v:
In Journal of Non-Crystalline Solids 2004 338:690-693
Autor:
Butte, R., Meaudre, R., Meaudre, M., Vignoli, S., Longeaud, C., Kleider, J. P., Cabarrocas, P. Rocai
Publikováno v:
Philosophical Magazine B. Jul99, Vol. 79 Issue 7, p1079-1096. 18p. 3 Charts, 12 Graphs.
Publikováno v:
In Materials Science & Engineering B 2002 94(2):264-268
Autor:
Kleider, J.P. *, Longeaud, C., Meaudre, R., Meaudre, M., Vignoli, S., Koughia, K.V., Terukov, E.I., Konkov, O.I.
Publikováno v:
In Materials Science & Engineering B 2001 81(1):71-73
Publikováno v:
In Thin Solid Films 2000 366(1):207-210
Autor:
Gueunier, M. E., Kleider, J. P., Brüggemann, R., Lebib, S., Roca i Cabarrocas, P., Meaudre, R., Canut, B.
Publikováno v:
Journal of Applied Physics; 11/1/2002, Vol. 92 Issue 9, p4959, 9p, 1 Diagram, 3 Charts, 9 Graphs
Publikováno v:
Philosophical Magazine Letters. Sep99, Vol. 79 Issue 9, p763-769. 7p. 1 Chart, 3 Graphs.