Zobrazeno 1 - 10
of 302
pro vyhledávání: '"Meaudre, M"'
Autor:
Gueunier-Farret, M.E., Bazin, C., Kleider, J.P., Longeaud, C., Bulkin, P., Daineka, D., Dao, T.H., Roca i Cabarrocas, P., Descamps, P., Kervyn de Meerendre, T., Leempoel, P., Meaudre, M., Meaudre, R.
Publikováno v:
In Journal of Non-Crystalline Solids 15 June 2006 352(9-20):1913-1916
Deep defects and their electron-capture cross sections in polymorphous silicon-germanium thin films.
Publikováno v:
Journal of Applied Physics; 8/1/2005, Vol. 98 Issue 3, p033531, 7p, 1 Color Photograph, 2 Charts, 4 Graphs
Autor:
Meaudre *, R. (AUTHOR), Meaudre, M. (AUTHOR)
Publikováno v:
Philosophical Magazine Letters. Apr2005, Vol. 85 Issue 4, p185-192. 8p.
Autor:
Meaudre, R., Meaudre, M.
Publikováno v:
Philosophical Magazine Letters. May2002, Vol. 82 Issue 5, p303-312. 10p.
Publikováno v:
In Materials Science & Engineering B 2002 94(2):264-268
Publikováno v:
In Journal of Non-Crystalline Solids 2002 299 Part 1:482-486
Publikováno v:
In Journal of Non-Crystalline Solids 2002 299 Part 1:626-631
Publikováno v:
In Journal of Non-Crystalline Solids 2002 299 Part 1:220-225
Autor:
Kleider, J.P. *, Longeaud, C., Meaudre, R., Meaudre, M., Vignoli, S., Koughia, K.V., Terukov, E.I., Konkov, O.I.
Publikováno v:
In Materials Science & Engineering B 2001 81(1):71-73
Publikováno v:
In Thin Solid Films 2000 366(1):207-210