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pro vyhledávání: '"Md Kawser Bepary"'
Publikováno v:
Applied Sciences, Vol 12, Iss 9, p 4332 (2022)
The cells in dynamic random access memory (DRAM) degrade over time as a result of aging, leading to poor performance and potential security vulnerabilities. With a globalized horizontal supply chain, aged counterfeit DRAMs could end up on the market,
Externí odkaz:
https://doaj.org/article/de8421590b654dd581f6b4a78617a855
Publikováno v:
2023 IEEE 16th Dallas Circuits and Systems Conference (DCAS).