Zobrazeno 1 - 10
of 10
pro vyhledávání: '"McGehee WR"'
Autor:
Martinez GD; Time and Frequency Division, National Institute of Standards and Technology, Boulder, CO, USA.; Department of Physics, University of Colorado Boulder, Boulder, CO, USA., Li C; School of Physics, Georgia Institute of Technology, Atlanta, GA, USA. lichao@gatech.edu.; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA. lichao@gatech.edu., Staron A; Time and Frequency Division, National Institute of Standards and Technology, Boulder, CO, USA.; Department of Physics, University of Colorado Boulder, Boulder, CO, USA., Kitching J; Time and Frequency Division, National Institute of Standards and Technology, Boulder, CO, USA., Raman C; School of Physics, Georgia Institute of Technology, Atlanta, GA, USA., McGehee WR; Time and Frequency Division, National Institute of Standards and Technology, Boulder, CO, USA. william.mcgehee@nist.gov.
Publikováno v:
Nature communications [Nat Commun] 2023 Jun 13; Vol. 14 (1), pp. 3501. Date of Electronic Publication: 2023 Jun 13.
Autor:
McGehee WR; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Strelcov E; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.; Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States., Oleshko VP; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Soles C; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., Zhitenev NB; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States., McClelland JJ; National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
ACS nano [ACS Nano] 2019 Jul 23; Vol. 13 (7), pp. 8012-8022. Date of Electronic Publication: 2019 Jul 10.
Autor:
Xu W; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA., McGehee WR; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA., Morong WN; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA., DeMarco B; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA. bdemarco@illinois.edu.
Publikováno v:
Nature communications [Nat Commun] 2019 Apr 08; Vol. 10 (1), pp. 1588. Date of Electronic Publication: 2019 Apr 08.
Autor:
Gardner JR; Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., McGehee WR; Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., McClelland JJ; Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Publikováno v:
Journal of applied physics [J Appl Phys] 2019; Vol. 125.
Autor:
McGehee WR; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Michels T; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Department for Microelectronic and Nanoelectronic Systems, University of Technology Ilmenau, Germany., Aksyuk V; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., McClelland JJ; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Optica [Optica] 2017 Nov; Vol. 4 (11), pp. 1444-1450. Date of Electronic Publication: 2017 Nov 20.
Autor:
Takeuchi S; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., McGehee WR; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Schaefer JL; University of Notre Dame, Department of Chemical and Biomolecular Engineering, Notre Dame, IN 46556, USA., Wilson TM; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Twedt KA; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; Maryland Nanocenter, University of Maryland, College Park, MD., Chang EH; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Soles CL; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Oleshko VP; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., McClelland JJ; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Journal of the Electrochemical Society [J Electrochem Soc] 2016; Vol. 163 (6), pp. A1010-A1012. Date of Electronic Publication: 2016 Mar 22.
Autor:
Kondov SS; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., McGehee WR; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., Xu W; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., DeMarco B; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2015 Feb 27; Vol. 114 (8), pp. 083002. Date of Electronic Publication: 2015 Feb 26.
Autor:
McGehee WR; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., Kondov SS; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., Xu W; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., Zirbel JJ; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., DeMarco B; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2014 Aug 29; Vol. 113 (9), pp. 099602. Date of Electronic Publication: 2014 Aug 26.
Autor:
McGehee WR; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA., Kondov SS, Xu W, Zirbel JJ, DeMarco B
Publikováno v:
Physical review letters [Phys Rev Lett] 2013 Oct 04; Vol. 111 (14), pp. 145303. Date of Electronic Publication: 2013 Oct 02.
Autor:
Kondov SS; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA., McGehee WR, Zirbel JJ, DeMarco B
Publikováno v:
Science (New York, N.Y.) [Science] 2011 Oct 07; Vol. 334 (6052), pp. 66-8.