Zobrazeno 1 - 10
of 89
pro vyhledávání: '"McFadzean, S."'
Autor:
McVitie, S., Hughes, S., Fallon, K., McFadzean, S., McGrouther, D., Krajnak, M., Legrand, W., Maccariello, D., Collin, S., Garcia, K., Reyren, N., Cros, V., Fert, A., Zeissler, K., Marrows, C. H.
Publikováno v:
Sci. Rep. 8, 5703 (2018)
Skyrmions in ultrathin ferromagnetic metal (FM)/heavy metal (HM) multilayer systems produced by conventional sputtering methods have recently generated huge interest due to their applications in the field of spintronics. The sandwich structure with t
Externí odkaz:
http://arxiv.org/abs/1711.05552
Autor:
Zeissler, K., Mruczkiewicz, M., Finizio, S., Raabe, J., Shepley, P. M., Sadovnikov, A. V., Nikitov, S. A., Fallon, K., McFadzean, S., McVitie, S., Moore, T. A., Burnell, G., Marrows, C. H.
We have imaged N\'eel skyrmion bubbles in perpendicularly magnetised polycrystalline multilayers patterned into 1 \mu m diameter dots, using scanning transmission x-ray microscopy. The skyrmion bubbles can be nucleated by the application of an extern
Externí odkaz:
http://arxiv.org/abs/1706.01065
Autor:
McGrouther, D., Lamb, R. J., Krajnak, M., McFadzean, S., McVitie, S., Stamps, R. L., Leonov, A. O., Bogdanov, A. N., Togawa, Y.
We have utilised a high spatial resolution imaging method, Differential Phase Contrast (DPC) performed in a scanning transmission electron microscope (STEM), for precise measurement of the magnetic induction distribution in skyrmion states in noncent
Externí odkaz:
http://arxiv.org/abs/1606.04681
Autor:
Benitez, M. J., Basith, M. A., McGrouther, D., McFadzean, S., MacLaren, D. A., Hrabec, A., Lamb, R. J., Marrows, C. H., McVitie, S.
Using Lorentz transmission electron microscopy we investigate the behavior of domain walls pinned at non-topographic defects in Cr(3 nm)/Permalloy(10 nm)/Cr(5 nm) nanowires of width 500 nm. The pinning sites consist of linear defects where magnetic p
Externí odkaz:
http://arxiv.org/abs/1501.01410
Publikováno v:
In Ultramicroscopy October 2020 217
Akademický článek
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Akademický článek
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Autor:
Docherty, F.T., MacKenzie, M., Craven, A.J., McComb, D.W., Gendt, S. De, McFadzean, S., McGilvery, C.M.
Publikováno v:
In Microelectronic Engineering 2008 85(1):61-64
Autor:
Daly, Luke, Lee, Martin, Bagot, P.A., Halpin, John, Smith, W., McFadzean, S., O'Brien, A.C., Griffin, S., Cohen, B.E.
The upcoming Mars Sample Return (MSR) mission aims to deliver small quantities of Martian rocks to the Earth. Investigating these precious samples requires the development and application of techniques that can extract the greatest amount of high qua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::38b357320d33f237163041c10e08447e
https://eprints.gla.ac.uk/209456/1/209456.pdf
https://eprints.gla.ac.uk/209456/1/209456.pdf
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This covers the instrumental aspects of how to best set up a scanning transmission electron microscope and post-column spectrometer combination to provide bes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::e77bcc8d4b09548b65648dcd5bf3d480