Zobrazeno 1 - 10
of 23
pro vyhledávání: '"McArdle, Timothy J"'
Autor:
McArdle, Timothy J., Chu, Jack O., Zhu, Yu, Liu, Zihong, Krishnan, Mahadevaiyer, Breslin, Christopher M., Dimitrakopoulos, Christos, Wisnieff, Robert, Grill, Alfred
Publikováno v:
Applied Physics Letters 98, 132108 (2011)
We use ultra-high vacuum chemical vapor deposition to grow polycrystalline silicon carbide (SiC) on c-plane sapphire wafers which are then annealed between 1250 and 1450{\deg}C in vacuum to create epitaxial multilayer graphene (MLG). Despite the surf
Externí odkaz:
http://arxiv.org/abs/1103.6160
Autor:
Brenner, Matthew W., Gopalakrishnan, Sarang, Ku, Jaseung, McArdle, Timothy J., Eckstein, James N., Shah, Nayana, Goldbart, Paul M., Bezryadin, Alexey
Publikováno v:
Phys. Rev. B 83, 184503 (2011)
Microwave Fabry-Perot resonators containing nonlinear mesoscopic elements (such as superconducting nanowires) can be used to explore many-body circuit QED. Here, we report on observations of a superconductor-normal pulsing regime in microwave (GHz) c
Externí odkaz:
http://arxiv.org/abs/1101.0817
Autor:
Dimitrakopoulos, Christos, Lin, Yu-Ming, Grill, Alfred, Farmer, Damon B., Freitag, Marcus, Sun, Yanning, Han, Shu-Jen, Chen, Zhihong, Jenkins, Keith A., Zhu, Yu, Liu, Zihong, McArdle, Timothy J., Ott, John A., Wisnieff, Robert, Avouris, Phaedon
Publikováno v:
J. Vac. Sci. Technol. B 28, 985 (2010)
Up to two layers of epitaxial graphene have been grown on the Si-face of two-inch SiC wafers exhibiting room-temperature Hall mobilities up to 1800 cm^2/Vs, measured from ungated, large, 160 micron x 200 micron Hall bars, and up to 4000 cm^2/Vs, from
Externí odkaz:
http://arxiv.org/abs/1006.0980
Publikováno v:
Appl. Phys. Lett. 97, 233510 (2010)
Josephson junctions were fabricated using two different methods of barrier formation. The trilayers employed were Nb/Al-AlOx/Nb on sapphire, where the first two layers were epitaxial. The oxide barrier was formed either by exposing the Al surface to
Externí odkaz:
http://arxiv.org/abs/0812.3636
Autor:
Isil, Omur, Robert, Judson, Royer, Cyrille Le, Vanamurthy, Laks, Feudel, Thomas, Heyne, Tobias, Gerber, Ralf, Lenski, Markus, Jansen, Soren, Utess, Dirk, Klein, Christoph, Peeva, Anita, Robert, George, McArdle, Timothy J, Barge, David, Divay, Alexis, Lehmann, Steffen, Smith, Elliot, Peters, Carsten, Sachse, Uwe
Publikováno v:
ECS Transactions; July 2018, Vol. 86 Issue: 7 p199-206, 8p
Autor:
Carter, Rick J, Sporer, Ryan, McArdle, Timothy J, Robert, George, Robert, Judson, Beasor, Scott, Child, Amy, Fronheiser, Jody, Wahl, Jeremy A, Geisler, Holm, Kluth, George J, Triyoso, Dina H, Punchihewa, Kasun, Rana, Uzma, Vanamurthy, Laks, Sohn, D K
Publikováno v:
ECS Transactions; April 2018, Vol. 85 Issue: 6 p3-10, 8p
Autor:
Farhat, Saiqa, Rangarajan, Srinivasan, Mcardle, Timothy J., Steigerwalt, Michael, Dawei Hu, Ming Dai
Publikováno v:
25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014); 2014, p42-45, 4p
Autor:
Saenger, Katherine L., Lavoie, Christian, Carruthers, Roy, Bol, Ageeth A., Mcardle, Timothy J., Chu, Jack O., Tsang, James C., Grill, Alfred
Publikováno v:
MRS Online Proceedings Library; 2010, Vol. 1284 Issue 1, p39-44, 6p
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Akademický článek
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