Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Maylis Lavayssière"'
Autor:
Maylis Lavayssière, Alexandre Lefrançois, Bernard Crabos, Marc Genetier, Maxime Daudy, Sacha Comte, Alan Dufourmentel, Bruno Salsac, Frédéric Sol, Pascal Verdier, Patrick Pons
Publikováno v:
Sensors, Vol 23, Iss 12, p 5635 (2023)
This paper proposes two ways to improve pressure measurement in air-blast experimentations, mostly for close-in detonations defined by a small-scaled distance below 0.4 m.kg−1/3. Firstly, a new kind of custom-made pressure probe sensor is presented
Externí odkaz:
https://doaj.org/article/472188c23cf24cf18ec8f6714e0a6749
Autor:
Jérémi Mapas, Alexandre Lefrançois, Hervé Aubert, Sacha Comte, Yohan Barbarin, Maylis Lavayssière, Benoit Rougier, Alexandre Dore
Publikováno v:
Sensors, Vol 23, Iss 10, p 4835 (2023)
In this paper, a neural network approach is applied for solving an electromagnetic inverse problem involving solid dielectric materials subjected to shock impacts and interrogated by a millimeter-wave interferometer. Under mechanical impact, a shock
Externí odkaz:
https://doaj.org/article/57ce6f895588449e9902cd8ea3eeebff
Autor:
Sébastien Maqueda, Julien Perchoux, Clément Tronche, José Javier Imas González, Marc Genetier, Maylis Lavayssière, Yohan Barbarin
Publikováno v:
Sensors, Vol 23, Iss 7, p 3720 (2023)
In this paper, we demonstrate that a compact and inexpensive interferometric sensor based on the self-mixing effect in the laser cavity can be used for the characterization of shock waves. The sensor measures the changes in the refractive index induc
Externí odkaz:
https://doaj.org/article/5ffe9c9245fe4f05b0b513bbe7f2a8a7
Autor:
Kevin Sanchez, Bilel Achour, Anthony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière, Alexandre Lefrançois, Hervé Aubert, Patrick Pons
Publikováno v:
Sensors, Vol 22, Iss 24, p 9571 (2022)
Blast waves generated by energetic materials involve very fast time variations in the pressure. One important issue for blast wave metrology is the accurate measurement (typical precision in the range of ±5% or better) of the static overpressure pea
Externí odkaz:
https://doaj.org/article/7d824c4d1be249a9a882489103682043
Autor:
Pons, Maylis Lavayssière, Alexandre Lefrançois, Bernard Crabos, Marc Genetier, Maxime Daudy, Sacha Comte, Alan Dufourmentel, Bruno Salsac, Frédéric Sol, Pascal Verdier, Patrick
Publikováno v:
Sensors; Volume 23; Issue 12; Pages: 5635
This paper proposes two ways to improve pressure measurement in air-blast experimentations, mostly for close-in detonations defined by a small-scaled distance below 0.4 m.kg−1/3. Firstly, a new kind of custom-made pressure probe sensor is presented
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::0e2714b4a66e365f4fcc619058e19025
Autor:
Maylis Lavayssière, Jérôme Willemin, Aurélien Hottelet, Nicolas Stephanopoli, Clément Grein, Clément Garaffa, Esteban Cabanillas, Prince Ramahefa-Andry, Stéphane Driussi, Martin Gauroy, Justin Boussac, Stephan Louwers
Publikováno v:
2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70dcfe44d3005f638b5550cc908a987c
https://doi.org/10.1109/inertial56358.2023.10104024
https://doi.org/10.1109/inertial56358.2023.10104024
Autor:
Julien Veyrunes, Jérôme Riondet, André Ferrand, Maylis Lavayssière, Alexandre Lefrançois, Jérôme Luc, Hervé Aubert, Patrick Pons
Publikováno v:
Proceedings, Vol 2, Iss 13, p 727 (2018)
The development of new ultra-fast sensors for pressure air blast monitoring requires taking into account the very short rise time of pressure occurring during explosion. Simulations show here that the dynamic mechanical behavior of membrane-based sen
Externí odkaz:
https://doaj.org/article/234241d8958f44e1906f46f41eb3b212
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena
Journal of Electron Spectroscopy and Related Phenomena, Elsevier, 2013, 186, pp.30-38. ⟨10.1016/j.elspec.2013.01.014⟩
Journal of Electron Spectroscopy and Related Phenomena, 2013, 186, pp.30-38. ⟨10.1016/j.elspec.2013.01.014⟩
Journal of Electron Spectroscopy and Related Phenomena, Elsevier, 2013, 186, pp.30-38. ⟨10.1016/j.elspec.2013.01.014⟩
Journal of Electron Spectroscopy and Related Phenomena, 2013, 186, pp.30-38. ⟨10.1016/j.elspec.2013.01.014⟩
International audience; Photoelectron emission microscopy (PEEM) is a powerful non-destructive tool for spatially resolved, spectroscopic analysis of surfaces with sub-micron chemical heterogeneities. However, in the case of micron scale patterned se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbe9649faafdb1c97f3e1239991d7731
https://hal-cea.archives-ouvertes.fr/cea-01477558/file/1-s2.0-S0368204813000169-main.pdf
https://hal-cea.archives-ouvertes.fr/cea-01477558/file/1-s2.0-S0368204813000169-main.pdf
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena
Journal of Electron Spectroscopy and Related Phenomena, 2009, 171, pp.68. ⟨10.1016/j.elspec.2009.03.008⟩
Journal of Electron Spectroscopy and Related Phenomena, Elsevier, 2009, 171, pp.68. ⟨10.1016/j.elspec.2009.03.008⟩
Journal of Electron Spectroscopy and Related Phenomena, 2009, 171, pp.68. ⟨10.1016/j.elspec.2009.03.008⟩
Journal of Electron Spectroscopy and Related Phenomena, Elsevier, 2009, 171, pp.68. ⟨10.1016/j.elspec.2009.03.008⟩
International audience; Core level photoelectron spectromicroscopy in laboratory conditions (XPS imaging) with standard Al Kalpha1 excitation (1486.6 eV), either in scanning or parallel imaging mode, is currently limited to a spatial resolution of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5273392d6ad5560483dc7f7e4ce2d871
https://hal.science/hal-00704963
https://hal.science/hal-00704963
Autor:
Pierre Bleuet, Lucile Arnaud, Xavier Biquard, Peter Cloetens, Lise Doyen, Patrice Gergaud, Patrick Lamontagne, Maylis Lavayssière, Jean-Sébastien Micha, Olivier Renault, François Rieutord, Jean Susini, Olivier Ulrich, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold
Publikováno v:
AIP Conference Proceedings.
The advent of 3rd generation synchrotron sources coupled with high efficiency x‐ray focusing optics opened new nanocharacterization possibilities. This paper is an overview of synchrotron‐based techniques that may be of interest for nanotechnolog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef863d55ba28b072fa933290a07ea51b
https://doi.org/10.1063/1.3251217
https://doi.org/10.1063/1.3251217