Zobrazeno 1 - 1
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pro vyhledávání: '"Maxim N. Nikiforov"'
Publikováno v:
Applied Physics Letters. 93:182101
Nanometer sized defects in thin HfOx films are detected by atomic force microscopy facilitated leakage current measurements. Differences in the electrical properties of individual defects were distinguished. The effects of two mechanisms that localiz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f95e78ad6038c3bbef2553dfdfb9a6c
https://doi.org/10.1063/1.2982082
https://doi.org/10.1063/1.2982082
