Zobrazeno 1 - 10
of 50
pro vyhledávání: '"Max Haider"'
Autor:
Masashi Watanabe, Giulio Guzzinati, Volker Gerheim, Martin Linck, Heiko Müller, Max Haider, Thomas Isabell, Hidetaka Sawada
Publikováno v:
Microscopy and Microanalysis. 28:2644-2647
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab74e4cb2351aa4731daf6e1b468d558
https://doi.org/10.1017/s1431927622010029
https://doi.org/10.1017/s1431927622010029
Publikováno v:
Microscopy and Microanalysis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f93c9c8a66eff96096fefc3af1e0f671
Autor:
Martin Linck, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser, Max Haider
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82e6f8abd3851ef24682559e0233ba10
https://doi.org/10.1002/9783527808465.emc2016.4572
https://doi.org/10.1002/9783527808465.emc2016.4572
Autor:
Fumio Hosokawa, John L. Hutchison, Ron C. Doole, Takeshi Tomita, David J. H. Cockayne, Mikio Naruse, Nobuo Tanaka, C. J. D. Hetherington, Hidetaka Sawada, Toshikazu Honda, Peter Hartel, Toshikatsu Kaneyama, J.M. Titchmarsh, Max Haider, Angus I. Kirkland
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e558de5ebc3ce8d4124fe81e7bf16ae8
https://ora.ox.ac.uk/objects/uuid:61007381-13aa-4da2-9c41-8cc5f3b44189
https://ora.ox.ac.uk/objects/uuid:61007381-13aa-4da2-9c41-8cc5f3b44189
Autor:
Zhongbo Lee, Martin Linck, Frank Kahl, Ute Kaiser, Johannes Biskupek, Maarten Bischoff, Harald Rose, Marcel Niestadt, Stephan Uhlemann, Max Haider, J. Zach, Tibor Lehnert, Heiko Müller, Felix Börrnert, Peter Hartel
Publikováno v:
Physical review letters. 117(7)
Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic aberration deteriorates the resolution of the T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa6993c044f11059b06fee9433259dbb
https://pubmed.ncbi.nlm.nih.gov/27563976
https://pubmed.ncbi.nlm.nih.gov/27563976
Publikováno v:
Microscopy Today. 18:34-37
At last year's M&M meeting, the birth centennial of Otto Scherzer, one of the pioneers of electron optics and particularly the correction of electron-optical lenses, was remembered in a special symposium. His scientific achievements have been extensi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ae535cea7f52efebe08f9894c2e346b
https://doi.org/10.1017/s1551929510000453
https://doi.org/10.1017/s1551929510000453
Autor:
Frank Kahl, Marcel Niestadt, Stephan Uhlemann, Heiko Müller, Ute Kaiser, Peter Hartel, Max Haider, Martin Linck, Johannes Biskupek, J. Zach
Publikováno v:
Microscopy and Microanalysis. 22:878-879
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9fb4fd3fc755c21a2556e16e618b8c2
https://doi.org/10.1017/s1431927616005237
https://doi.org/10.1017/s1431927616005237
Autor:
Heiko Müller, Max Haider, Harald Rose, Martin Linck, Peter Hartel, Johannes Biskupek, Zhongbo Lee, Tibor Lehnert, Ute Kaiser
Publikováno v:
Microscopy and Microanalysis. 22:894-895
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::710be3146dab6fe113267b0a881a1c3f
https://doi.org/10.1017/s1431927616005316
https://doi.org/10.1017/s1431927616005316
Publikováno v:
Journal of Electron Microscopy. 51:S51-S58
One of the most challenging tasks for high-resolution electron microscopy is the investigation of the atomic structure of defects, interfaces, and grain boundaries. In particular, the application of thin films in electronic devices requires detailed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d6d5a5bdb5bdf7d3f1ed50cf911646b
https://doi.org/10.1093/jmicro/51.supplement.s51
https://doi.org/10.1093/jmicro/51.supplement.s51
Autor:
Heiko Müller, Max Haider, Thomas Riedel, Hannes Lichte, Martin Linck, Felix Börrnert, Bernd Büchner, Angus I. Kirkland
Publikováno v:
Ultramicroscopy. 182:308
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4eb6af1bf16435948fd8ac5776eee5ac
https://doi.org/10.1016/j.ultramic.2017.06.005
https://doi.org/10.1016/j.ultramic.2017.06.005